Real-time analysis of a surface phase transition of GaAs (001) by core-level photoelectron spectroscopy and photoelectron diffraction

2004 ◽  
Vol 137-140 ◽  
pp. 107-112 ◽  
Author(s):  
Fumihiko Maeda ◽  
Yoshio Watanabe
Keyword(s):  
Phase Transition ◽  
Real Time ◽  
Photoelectron Spectroscopy ◽  
Core Level ◽  
Surface Phase ◽  
Time Analysis ◽  
Surface Phase Transition ◽  
Photoelectron Diffraction ◽  
Real Time Analysis

Real-Time Analysis of GaSb(001) during Sb Desorption by Core-Level Photoelectron Spectroscopy

1997 ◽  
Vol 78 (22) ◽  
pp. 4233-4236 ◽  
Author(s):  
Fumihiko Maeda ◽  
Yoshio Watanabe ◽  
Masaharu Oshima
Keyword(s):  
Real Time ◽  
Photoelectron Spectroscopy ◽  
Core Level ◽  
Time Analysis ◽  
Real Time Analysis

Photoelectron diffraction and photoelectron holography study of a Ge(111) high-temperature surface phase transition

1993 ◽  
Vol 281 (3) ◽  
pp. 178-179
Author(s):  
T.T. Tran ◽  
S. Thevuthasan ◽  
Y.J. Kim ◽  
D.J. Friedman ◽  
A.P. Kaduwela ◽  
...  
Keyword(s):  
Phase Transition ◽  
High Temperature ◽  
Surface Phase ◽  
Surface Phase Transition ◽  
Photoelectron Diffraction ◽  
Temperature Surface

Photoelectron diffraction and photoelectron holography study of a Ge(111) high-temperature surface phase transition

1993 ◽  
Vol 281 (3) ◽  
pp. 270-284 ◽  
Author(s):  
T.T. Tran ◽  
S. Thevuthasan ◽  
Y.J. Kim ◽  
D.J. Friedman ◽  
A.P. Kaduwela ◽  
...  
Keyword(s):  
Phase Transition ◽  
High Temperature ◽  
Surface Phase ◽  
Surface Phase Transition ◽  
Photoelectron Diffraction ◽  
Temperature Surface

Real-time analysis for MBE by time-resolved core-level photoelectron spectroscopy

1998 ◽  
Vol 5 (3) ◽  
pp. 1026-1028 ◽  
Author(s):  
Fumihiko Maeda ◽  
Yoshio Watanabe ◽  
Masaharu Oshima ◽  
Masami Taguchi ◽  
Retsu Oiwa
Keyword(s):  
Synchrotron Radiation ◽  
Real Time ◽  
Photoelectron Spectroscopy ◽  
Measurement Method ◽  
Photoelectron Spectra ◽  
Time Analysis ◽  
Time Resolved ◽  
Molecular Beam Epitaxial ◽  
Real Time Analysis ◽  
Molecular Beam Epitaxial Growth

A system has been developed for the real-time analysis of surface reactions during molecular beam epitaxial growth which uses photoelectron spectroscopy with VUV light taken from synchrotron radiation. This system consists of a synchrotron radiation beamline and growth/analysis apparatus in which photoelectron spectroscopy is performed with sub-second time resolution. In this system, photoelectron spectra are measured in sequence by a `non-scanning' measurement method that enables the acquisition of snapshot photoelectron spectra using a multi-channel detector. This non-scanning measurement method was enabled by equipping an electric field correction grid. This system was used to monitor the photoelectron spectra of a GaSb(001) surface.

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