scholarly journals On Critical Exponents and the Renormalization of the Coupling Constant in Growth Models with Surface Diffusion

1997 ◽  
Vol 78 (6) ◽  
pp. 1082-1085 ◽  
Author(s):  
H. K. Janssen
Fractals ◽  
1993 ◽  
Vol 01 (04) ◽  
pp. 745-752
Author(s):  
CHI-HANG LAM ◽  
LEONARD M. SANDER

We propose an inverse method to extract effective couplings and the renormalization group flow for growing interfaces. We apply it to discrete surface growth models in the Kardar-Parisi-Zhang universality class in 1+1 dimensions and obtain the first measurement of a universal coupling constant. We consider interfaces not in the steady state. It may also be applicable to analyze experimental data and for other forms of interface growth.


2018 ◽  
Vol 511 ◽  
pp. 240-250 ◽  
Author(s):  
Tung B.T. To ◽  
Vitor B. de Sousa ◽  
Fábio D.A. Aarão Reis

Author(s):  
J.T. Fourie

Contamination in electron microscopes can be a serious problem in STEM or in situations where a number of high resolution micrographs are required of the same area in TEM. In modern instruments the environment around the specimen can be made free of the hydrocarbon molecules, which are responsible for contamination, by means of either ultra-high vacuum or cryo-pumping techniques. However, these techniques are not effective against hydrocarbon molecules adsorbed on the specimen surface before or during its introduction into the microscope. The present paper is concerned with a theory of how certain physical parameters can influence the surface diffusion of these adsorbed molecules into the electron beam where they are deposited in the form of long chain carbon compounds by interaction with the primary electrons.


1987 ◽  
Vol 48 (4) ◽  
pp. 553-558 ◽  
Author(s):  
B. Bonnier ◽  
Y. Leroyer ◽  
C. Meyers

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