Preferential sputtering of isotopes: Fluence and emission-angle dependence

1989 ◽  
Vol 63 (24) ◽  
pp. 2673-2676 ◽  
Author(s):  
H. Gnaser ◽  
H. Oechsner
Keyword(s):  
Emission Angle ◽  
Angle Dependence ◽  
Preferential Sputtering

Si 2p Core Level Shifts of the Epitaxial SiON Layer on a SiC(0001), Studied by Photoemissin Spectroscopy

2011 ◽  
Vol 675-677 ◽  
pp. 15-19 ◽  
Author(s):  
T. Shirasawa ◽  
S. Tanaka ◽  
T. Muro ◽  
Y. Tamenori ◽  
Y. Harada ◽  
...  
Keyword(s):  
Chemical Shifts ◽  
Emission Angle ◽  
Core Level ◽  
Silicon Oxynitride ◽  
Photoemission Spectroscopy ◽  
Structure Model ◽  
Epitaxial Silicon ◽  
Angle Dependence ◽  
Spectral Components ◽  
Level Shifts

The epitaxial silicon oxynitride (SiON) layer grown on a 6H-SiC(0001) surface is studied with core level photoemission spectroscopy. Si 2p spectra show three spectral components other than the bulk one. Chemical shifts and emission angle dependence of these components are well explained within a framework of a determined structure model of the SiON layer.

DYNAMICAL SIMULATION OF EMISSION ANGLE DEPENDENCE OF FRAGMENTS SPIN IN HEAVY ION FUSION–FISSION REACTIONS

2010 ◽  
Vol 19 (07) ◽  
pp. 1451-1461 ◽  
Author(s):  
M. R. PAHLAVANI ◽  
D. NADERI ◽  
S. M. MIRFATHI
Keyword(s):  
Experimental Data ◽  
Heavy Ion ◽  
Emission Angle ◽  
Fission Reactions ◽  
Angle Dependence ◽  
Dynamical Simulation ◽  
Deformation Parameters ◽  
Average Spin ◽  
Neck Thickness ◽  
Heavy Ion Fusion

In this paper, a formalism consisting of multi-dimensional Langevin equation (LE) and Scission point Transition State Model (SCTSM) have been applied to study the angle dependence of fragment's average spin for 16 O + 209 Bi and 16 O + 232 Th systems. The influence of asymmetry and deformation parameters, neck thickness of compound nucleus and pre-scission neutron multiplicity on the fragment's average spin is discussed. Results obtained using this approach are in better agreement with the experimental data as compared with the SCTSM.

Emission angle dependence of fission fragment spin in12C,16O,and19F+232Threactions

1998 ◽  
Vol 58 (2) ◽  
pp. R616-R620 ◽  
Author(s):  
D. V. Shetty ◽  
R. K. Choudhury ◽  
B. K. Nayak ◽  
D. M. Nadkarni ◽  
S. S. Kapoor
Keyword(s):  
Fission Fragment ◽  
Emission Angle ◽  
Angle Dependence

Emission-angle dependence of fission fragment spin

1992 ◽  
Vol 46 (4) ◽  
pp. 1445-1450 ◽  
Author(s):  
T. Datta ◽  
S. P. Dange ◽  
H. Naik ◽  
Satya Prakash
Keyword(s):  
Fission Fragment ◽  
Emission Angle ◽  
Angle Dependence

TWO-DIMENSIONAL CIRCULARLY-POLARIZED-LIGHT PHOTOELECTRON DIFFRACTION FOR THE ANALYSIS OF MAGNETIC AND ELECTRONIC PROPERTIES ON SURFACES

2000 ◽  
Vol 07 (05n06) ◽  
pp. 643-647 ◽  
Author(s):  
K. ENOMOTO ◽  
Y. MIYATAKE ◽  
K. FUKUMOTO ◽  
A. KOBAYASHI ◽  
K. HATTORI ◽  
...  
Keyword(s):  
Electronic Properties ◽  
Polarized Light ◽  
Emission Angle ◽  
Two Dimensional ◽  
Circularly Polarized Light ◽  
Circularly Polarized ◽  
Photoelectron Diffraction ◽  
Angle Dependence ◽  
First Time ◽  
Good Agreement

Circular dichroism has been measured in the photoelectron diffraction of bulk W 4f photoelectrons from the W(110)(1×1) clean surface. The forward focusing peaks along the symmetric axis in the diffraction pattern showed an azimuthal rotation similar to those reported in a prior experiment on Si(001) and chemically shifted W 4f photoelectrons from the W(110)(1×1)-O surface. The emission angle dependence of the rotation angles has been measured and analyzed for the first time and the angles observed are in good agreement with those calculated using the formula Δ ϕ=m/kR sin 2θ derived previously by Daimon et al. [Jpn. J. Phys.32, L1480 (1993)] considering the angular dependence of m. This property gives a basis for the analysis of structure or various magnetic and electronic properties on surfaces.

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