Comment on "Crossover from Josephson Tunneling to the Coulomb Blockade in Small Tunnel Junctions"

1989 ◽  
Vol 62 (4) ◽  
pp. 483-483 ◽  
Author(s):  
Behzad Mirhashem ◽  
Richard A. Ferrell
1988 ◽  
Vol 60 (23) ◽  
pp. 2414-2417 ◽  
Author(s):  
M. Iansiti ◽  
A. T. Johnson ◽  
C. J. Lobb ◽  
M. Tinkham

1993 ◽  
Vol 70 (19) ◽  
pp. 2940-2943 ◽  
Author(s):  
K. A. Matveev ◽  
M. Gisselfält ◽  
L. I. Glazman ◽  
M. Jonson ◽  
R. I. Shekhter

1991 ◽  
Author(s):  
H. van Kempen ◽  
R. T. M. Smokers ◽  
P. J. M. vanBentum

1996 ◽  
Vol 227 (1-4) ◽  
pp. 102-104
Author(s):  
Yoshihiro Shimazu ◽  
Seiichiro Ikehata ◽  
Shun-ichi Kobayashi

2000 ◽  
Vol 76 (13) ◽  
pp. 1698-1700 ◽  
Author(s):  
Junji Haruyama ◽  
Ken-ichiro Hijioka ◽  
Motohiro Tako ◽  
Yuki Sato

2003 ◽  
Vol 83 (7) ◽  
pp. 1429-1431 ◽  
Author(s):  
Eiichiro Watanabe ◽  
Kazuhito Tsukagoshi ◽  
Dai Kanai ◽  
Iwao Yagi ◽  
Yoshinobu Aoyagi

1992 ◽  
Vol 06 (05) ◽  
pp. 273-280 ◽  
Author(s):  
M.D. REEVE ◽  
O.G. SYMKO ◽  
R. LI

Tunneling studies between a Scanning Tunneling Microscope (STM)-controlled fine NbN tip and a NbN thin film show single electron tunneling characteristics at room temperature. The I-V curves display the Coulomb blockade and the Coulomb staircase caused by single electron charging of a series combination of two tunnel junctions. These room temperature observations indicate that it may be possible to operate single-electron-based devices in non-cryogenic regimes.


1999 ◽  
Vol 86 (7) ◽  
pp. 3844-3847 ◽  
Author(s):  
Tobias Bergsten ◽  
Tord Claeson ◽  
Per Delsing

Sign in / Sign up

Export Citation Format

Share Document