X-ray reflectivity study of interface roughness, structure, and morphology of alignment layers and thin liquid crystal films

1995 ◽  
Vol 51 (1) ◽  
pp. 526-535 ◽  
Author(s):  
Brian Cull ◽  
Yushan Shi ◽  
Satyendra Kumar ◽  
Raymond Shih ◽  
J. Mann
2017 ◽  
Vol 647 (1) ◽  
pp. 169-178 ◽  
Author(s):  
I. A. Zaluzhnyy ◽  
R. P. Kurta ◽  
A. P. Menushenkov ◽  
B. I. Ostrovskii ◽  
I. A. Vartanyants

1987 ◽  
Vol 36 (6) ◽  
pp. 2890-2901 ◽  
Author(s):  
E. B. Sirota ◽  
P. S. Pershan ◽  
L. B. Sorensen ◽  
J. Collett

1995 ◽  
Vol 78 (5) ◽  
pp. 3323-3329 ◽  
Author(s):  
R. Pogreb ◽  
G. Cohen ◽  
M. Tarabia ◽  
D. Davidov ◽  
M. Levine ◽  
...  

1990 ◽  
Vol 65 (17) ◽  
pp. 2157-2160 ◽  
Author(s):  
Douglas J. Tweet ◽  
Robert Hołyst ◽  
Brian D. Swanson ◽  
Hans Stragier ◽  
Larry B. Sorensen

1984 ◽  
Vol 52 (24) ◽  
pp. 2190-2190 ◽  
Author(s):  
Jeffrey Collett ◽  
P. S. Pershan ◽  
Eric B. Sirota ◽  
L. B. Sorensen

1984 ◽  
Vol 52 (5) ◽  
pp. 356-359 ◽  
Author(s):  
Jeffrey Collett ◽  
P. S. Pershan ◽  
Eric B. Sirota ◽  
L. B. Sorensen

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