Combined interface plasmon polariton and x‐ray reflectivity determination of the dielectric tensor in ultrathin liquid crystal films

1995 ◽  
Vol 78 (5) ◽  
pp. 3323-3329 ◽  
Author(s):  
R. Pogreb ◽  
G. Cohen ◽  
M. Tarabia ◽  
D. Davidov ◽  
M. Levine ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Dielectric Tensor ◽  
X Ray ◽  
Liquid Crystal Films ◽  
Crystal Films ◽  
Plasmon Polariton

X-ray determination of the molecular tilt and layer fluctuation profiles of freely suspended liquid-crystal films

1990 ◽  
Vol 65 (17) ◽  
pp. 2157-2160 ◽  
Author(s):  
Douglas J. Tweet ◽  
Robert Hołyst ◽  
Brian D. Swanson ◽  
Hans Stragier ◽  
Larry B. Sorensen
Keyword(s):  
Liquid Crystal ◽  
X Ray ◽  
Liquid Crystal Films ◽  
Crystal Films ◽  
Freely Suspended

scholarly journals Analysis of the shape of x-ray diffraction peaks originating from the hexatic phase of liquid crystal films

2017 ◽  
Vol 647 (1) ◽  
pp. 169-178 ◽  
Author(s):  
I. A. Zaluzhnyy ◽  
R. P. Kurta ◽  
A. P. Menushenkov ◽  
B. I. Ostrovskii ◽  
I. A. Vartanyants
Keyword(s):  
Liquid Crystal ◽  
X Ray Diffraction ◽  
X Ray ◽  
Liquid Crystal Films ◽  
Hexatic Phase ◽  
Crystal Films ◽  
Diffraction Peaks

scholarly journals X-ray and optical studies of the thickness dependence of the phase diagram of liquid-crystal films

1987 ◽  
Vol 36 (6) ◽  
pp. 2890-2901 ◽  
Author(s):  
E. B. Sirota ◽  
P. S. Pershan ◽  
L. B. Sorensen ◽  
J. Collett
Keyword(s):  
Phase Diagram ◽  
Liquid Crystal ◽  
Thickness Dependence ◽  
Optical Studies ◽  
X Ray ◽  
Liquid Crystal Films ◽  
Crystal Films

scholarly journals Synchrotron X-Ray Study of the Thickness Dependence of the Phase Diagram of Thin Liquid-Crystal Films

1984 ◽  
Vol 52 (24) ◽  
pp. 2190-2190 ◽  
Author(s):  
Jeffrey Collett ◽  
P. S. Pershan ◽  
Eric B. Sirota ◽  
L. B. Sorensen
Keyword(s):  
Phase Diagram ◽  
Liquid Crystal ◽  
Thickness Dependence ◽  
X Ray ◽  
Liquid Crystal Films ◽  
Crystal Films
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