Second-order gravitational effects of local inhomogeneities on CMB anisotropies in nonzero-Λflat cosmological models

2005 ◽  
Vol 72 (4) ◽  
Author(s):  
Kenji Tomita
Keyword(s):  
Cosmological Models ◽  
Second Order ◽  
Gravitational Effects

Artificial satellite orbit computations

1966 ◽  
Vol 25 ◽  
pp. 363-371
Author(s):  
P. Sconzo
Keyword(s):  
Artificial Satellite ◽  
Satellite Orbit ◽  
Artificial Satellites ◽  
Orbital Elements ◽  
Differential Correction ◽  
Gravitational Effects ◽  
Short Intervals ◽  
The Subject ◽  
Introductory Discussion ◽  
Orbit Computation

In this paper an orbit computation program for artificial satellites is presented. This program is operational and it has already been used to compute the orbits of several satellites.After an introductory discussion on the subject of artificial satellite orbit computations, the features of this program are thoroughly explained. In order to achieve the representation of the orbital elements over short intervals of time a drag-free perturbation theory coupled with a differential correction procedure is used, while the long range behavior is obtained empirically. The empirical treatment of the non-gravitational effects upon the satellite motion seems to be very satisfactory. Numerical analysis procedures supporting this treatment and experience gained in using our program are also objects of discussion.

Disappearance Voltage Determinations Using a Convergent Beam

1971 ◽  
Vol 29 ◽  
pp. 184-185
Author(s):  
W. L. Bell
Keyword(s):  
Second Order ◽  
Objective Method ◽  
Uniform Thickness ◽  
Rocking Curve ◽  
Crystal Perfection ◽  
Kikuchi Line ◽  
Central Maximum ◽  
Diffraction Patterns ◽  
Convergent Beam ◽  
Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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