scholarly journals Measurement of theB-meson inclusive semileptonic branching fraction and electron-energy moments

2004 ◽  
Vol 70 (3) ◽  
Author(s):  
A. H. Mahmood ◽  
S. E. Csorna ◽  
G. Bonvicini ◽  
D. Cinabro ◽  
M. Dubrovin ◽  
...  
Keyword(s):  
Electron Energy ◽  
Branching Fraction ◽  
Energy Moments

scholarly journals Measurement of the Branching Fraction and Photon Energy Moments ofB→XsγandACP(B→Xs+dγ)

2006 ◽  
Vol 97 (17) ◽  
Author(s):  
B. Aubert ◽  
R. Barate ◽  
M. Bona ◽  
D. Boutigny ◽  
F. Couderc ◽  
...  
Keyword(s):  
Photon Energy ◽  
Branching Fraction ◽  
Energy Moments

scholarly journals Determination of the Branching Fraction forB→XcℓνDecays and of|Vcb|from Hadronic-Mass and Lepton-Energy Moments

2004 ◽  
Vol 93 (1) ◽  
Author(s):  
B. Aubert ◽  
R. Barate ◽  
D. Boutigny ◽  
F. Couderc ◽  
J.-M. Gaillard ◽  
...  
Keyword(s):  
Branching Fraction ◽  
Hadronic Mass ◽  
Energy Moments

scholarly journals Study of the B → Xcℓν Decays and Determination of |Vcb|

2005 ◽  
Vol 20 (16) ◽  
pp. 3644-3647
Author(s):  
◽  
Vladimir Golubev
Keyword(s):  
Matrix Element ◽  
Heavy Quark ◽  
Electron Energy ◽  
Branching Fraction ◽  
Form Factors ◽  
Ckm Matrix ◽  
Mass Distributions ◽  
Babar Detector ◽  
Decay Form

We report studies of semileptonic decays, B → Xcℓν, based on a sample of 88 million [Formula: see text] events recorded with the BABAR detector. We have measured four moments of the electron energy and hadronic mass distributions and determined the inclusive branching fraction, the CKM matrix element |Vcb|, and other heavy quark parameters, using Heavy Quark Expansions in the kinetic mass scheme. In addition, we have studied a large sample of B0 → D*-ℓ+ν decays and extracted the decay form factors and |Vcb|.

scholarly journals DETERMINATION OF |Vcb| AND RELATED RESULTS FROM BABAR

2005 ◽  
Vol 20 (02n03) ◽  
pp. 557-560
Author(s):  
◽  
MASAHIRO MORII
Keyword(s):  
Matrix Element ◽  
Branching Fraction ◽  
Precise Determination ◽  
Ckm Matrix ◽  
Hadron Mass ◽  
Global Fit ◽  
Inclusive Semileptonic Decays ◽  
Babar Detector ◽  
Energy Moments

The CKM matrix element amplitude |Vcb| was determined using the data collected by the BABAR detector. The partial branching fraction, lepton-energy moments, and hadron-mass moments were measured in inclusive semileptonic decays B→Xcℓν. A global fit to a Heavy-Quark-Expansion calculation allowed precise determination of |Vcb|, mb, mc, ℬ(B→Xcℓν) and four non-perturbative parameters.

Data Acquisition and Handling Unit for a Quantitative Use of Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 232-233 ◽  
Author(s):  
P. Trebbia ◽  
P. Ballongue ◽  
C. Colliex
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Single Channel ◽  
Detection System ◽  
Surface Barrier ◽  
Solid State Detector ◽  
Electrostatic Mirror ◽  
Electron Energy Loss

An effective use of electron energy loss spectroscopy for chemical characterization of selected areas in the electron microscope can only be achieved with the development of quantitative measurements capabilities.The experimental assembly, which is sketched in Fig.l, has therefore been carried out. It comprises four main elements.The analytical transmission electron microscope is a conventional microscope fitted with a Castaing and Henry dispersive unit (magnetic prism and electrostatic mirror). Recent modifications include the improvement of the vacuum in the specimen chamber (below 10-6 torr) and the adaptation of a new electrostatic mirror.The detection system, similar to the one described by Hermann et al (1), is located in a separate chamber below the fluorescent screen which visualizes the energy loss spectrum. Variable apertures select the electrons, which have lost an energy AE within an energy window smaller than 1 eV, in front of a surface barrier solid state detector RTC BPY 52 100 S.Q. The saw tooth signal delivered by a charge sensitive preamplifier (decay time of 5.10-5 S) is amplified, shaped into a gaussian profile through an active filter and counted by a single channel analyser.

Trends in Electron Energy Loss Spectroscopy

1977 ◽  
Vol 35 ◽  
pp. 228-229
Author(s):  
C. Colliex ◽  
P. Trebbia
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Materials Science ◽  
Analytical Technique ◽  
Recent Developments ◽  
Quantitative Results ◽  
Electron Microscopes ◽  
Electron Energy Loss ◽  
Primary Electrons

The physical foundations for the use of electron energy loss spectroscopy towards analytical purposes, seem now rather well established and have been extensively discussed through recent publications. In this brief review we intend only to mention most recent developments in this field, which became available to our knowledge. We derive also some lines of discussion to define more clearly the limits of this analytical technique in materials science problems.The spectral information carried in both low ( 0<ΔE<100eV ) and high ( >100eV ) energy regions of the loss spectrum, is capable to provide quantitative results. Spectrometers have therefore been designed to work with all kinds of electron microscopes and to cover large energy ranges for the detection of inelastically scattered electrons (for instance the L-edge of molybdenum at 2500eV has been measured by van Zuylen with primary electrons of 80 kV). It is rather easy to fix a post-specimen magnetic optics on a STEM, but Crewe has recently underlined that great care should be devoted to optimize the collecting power and the energy resolution of the whole system.

Signal/Noise Ratio and Elemental Detectivity by Eels

1982 ◽  
Vol 40 ◽  
pp. 488-489
Author(s):  
R. F. Egerton
Keyword(s):  
Energy Loss ◽  
Electron Energy ◽  
Elemental Analysis ◽  
Electron Energy Loss Spectroscopy ◽  
Emission Spectroscopy ◽  
X Ray ◽  
Signal Noise ◽  
Characteristic Signal ◽  
Noise Ratio ◽  
Electron Energy Loss

An important parameter governing the sensitivity and accuracy of elemental analysis by electron energy-loss spectroscopy (EELS) or by X-ray emission spectroscopy is the signal/noise ratio of the characteristic signal.

Electron Energy Analysis of Germanium and Silica Layers on Silicon Substrates

1975 ◽  
Vol 33 ◽  
pp. 96-97
Author(s):  
R. W. Ditchfield ◽  
A. G. Cullis
Keyword(s):  
Epitaxial Growth ◽  
Electron Energy ◽  
Silicon Substrates ◽  
Secondary Phases ◽  
Si Substrates ◽  
Transmission Electron ◽  
Layer Structures ◽  
Si Films ◽  
Electron Energy Loss ◽  
Growth Centres

An energy analyzing transmission electron microscope of the Möllenstedt type was used to measure the electron energy loss spectra given by various layer structures to a spatial resolution of 100Å. The technique is an important, method of microanalysis and has been used to identify secondary phases in alloys and impurity particles incorporated into epitaxial Si films.Layers Formed by the Epitaxial Growth of Ge on Si Substrates Following studies of the epitaxial growth of Ge on (111) Si substrates by vacuum evaporation, it was important to investigate the possible mixing of these two elements in the grown layers. These layers consisted of separate growth centres which were often triangular and oriented in the same sense, as shown in Fig. 1.

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