Observation of shifts in total reflection of a light beam by a multilayered structure

1977 ◽  
Vol 15 (12) ◽  
pp. 3553-3562 ◽  
Author(s):  
O. Costa de Beauregard ◽  
C. Imbert ◽  
Y. Levy
Keyword(s):  
Light Beam ◽  
Multilayered Structure ◽  
Total Reflection

Light beam shifts in total reflection

2006 ◽  
Vol 266 (1) ◽  
pp. 336-341 ◽  
Author(s):  
Pierre Hillion
Keyword(s):  
Light Beam ◽  
Total Reflection

The time-dependent energy-flux pattern in total reflection of a pulsed light beam

2012 ◽  
Vol 14 (8) ◽  
pp. 085701
Author(s):  
Xiangmin Liu ◽  
Qingfen Yang ◽  
Pengfei Zhu ◽  
Yanli Zhang ◽  
Yan Shi
Keyword(s):  
Light Beam ◽  
Energy Flux ◽  
Total Reflection ◽  
Time Dependent ◽  
Pulsed Light

scholarly journals Theoretical Analysis of Tuning and Sensitivity Improvement of Surface Plasmon Resonance Biosensor employing Heterostructures of Titanium Disilicide and Graphene

2021 ◽  
Author(s):  
Balaji V R
Keyword(s):  
Surface Plasmon Resonance ◽  
Theoretical Analysis ◽  
Surface Plasmons ◽  
Graphene Layer ◽  
Multilayered Structure ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Titanium Disilicide ◽  
Sensitivity Improvement ◽  
Metal Titanium

Abstract In this work, a surface plasmons resonance-based biosensor is theoretically and mathematically investigated. The proposed sensor is a multilayered structure of the titanium disilicide and graphene along with Ag metal. These layers are stacked over the BK7 prism. The metal, titanium disilicide, and graphene layer thickness are taken as 45 nm, 2 nm, and 1.7 nm, respectively. The titanium disilicide is an air-stable 2-D material. The performance of the biosensor is analyzed using the attenuated total reflection (ATR) method. The proposed configuration has a maximum sensitivity of 183.4°/RIU, 47.45 % higher than the conventional sensor. The designed sensor has wide applications in chemical, medical, and biological analyte sensing.

Contribution of x-ray total reflection to the background intensity in EPMA

1990 ◽  
Vol 48 (2) ◽  
pp. 202-203
Author(s):  
Werner P. Rehbach ◽  
Peter Karduck
Keyword(s):  
Atomic Number ◽  
Target Material ◽  
Total Reflection ◽  
Background Intensity ◽  
X Rays ◽  
Characteristic Radiation ◽  
X Ray

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.

Determination of some heavy metals (Fe, Cu, Zn and Pb) in blood by total reflection X-ray fluorescence

2003 ◽  
Vol 107 ◽  
pp. 203-206 ◽  
Author(s):  
M. Bounakhla ◽  
A. Doukkali ◽  
K. Lalaoui ◽  
H. Aguenaou ◽  
N. Mokhtar ◽  
...  
Keyword(s):  
Heavy Metals ◽  
Total Reflection ◽  
X Ray
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