Light beam shifts in total reflection

2006 ◽  
Vol 266 (1) ◽  
pp. 336-341 ◽  
Author(s):  
Pierre Hillion
Keyword(s):  
2012 ◽  
Vol 14 (8) ◽  
pp. 085701
Author(s):  
Xiangmin Liu ◽  
Qingfen Yang ◽  
Pengfei Zhu ◽  
Yanli Zhang ◽  
Yan Shi

1977 ◽  
Vol 15 (12) ◽  
pp. 3553-3562 ◽  
Author(s):  
O. Costa de Beauregard ◽  
C. Imbert ◽  
Y. Levy

Author(s):  
Werner P. Rehbach ◽  
Peter Karduck

In the EPMA of soft x rays anomalies in the background are found for several elements. In the literature extremely high backgrounds in the region of the OKα line are reported for C, Al, Si, Mo, and Zr. We found the same effect also for Boron (Fig. 1). For small glancing angles θ, the background measured using a LdSte crystal is significantly higher for B compared with BN and C, although the latter are of higher atomic number. It would be expected, that , characteristic radiation missing, the background IB (bremsstrahlung) is proportional Zn by variation of the atomic number of the target material. According to Kramers n has the value of unity, whereas Rao-Sahib and Wittry proposed values between 1.12 and 1.38 , depending on Z, E and Eo. In all cases IB should increase with increasing atomic number Z. The measured values are in discrepancy with the expected ones.


2003 ◽  
Vol 107 ◽  
pp. 203-206 ◽  
Author(s):  
M. Bounakhla ◽  
A. Doukkali ◽  
K. Lalaoui ◽  
H. Aguenaou ◽  
N. Mokhtar ◽  
...  
Keyword(s):  

1973 ◽  
Vol 34 (5-6) ◽  
pp. 335-340 ◽  
Author(s):  
B. Julia ◽  
A. Neveu
Keyword(s):  

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