Acquisition of microstructural information during realistic service conditions is an ongoing need for fundamental materials insight and computational input. In addition, for engineering applications it is often important to be able to study materials over a wide range of penetration depths, from the surface to bulk. In this presentation we discuss developments at the Sector 1-ID beamline of the Advanced Photon Source (APS) to utilize high-energy x-ray scattering for such studies. The use of high-energies (~80 keV) provides a highly penetrating probe, with sampling depths up to several mm in most materials. Through the development and use of high-energy optics, we can perform both small- and wide-angle scattering (SAXS/WAXS), to probe a large range of sample dimensions in reciprocal space (ranging from Angstroms to hundreds of nanometers), with real space resolutions ranging from microns to mm.
Wide angle compton scattering