Wave function orthogonality in coupled-channel systems

1981 ◽  
Vol 23 (1) ◽  
pp. 19-32 ◽  
Author(s):  
Q. Haider ◽  
J. T. Londergan
Keyword(s):  
Wave Function ◽  
Coupled Channel ◽  
Channel Systems

scholarly journals Vector- and Pseudoscalar-baryon coupled channel systems

2012 ◽  
Vol 374 ◽  
pp. 012007
Author(s):  
K P Khemchandani ◽  
A Martínez Torres ◽  
H Kaneko ◽  
H Nagahiro ◽  
A Hosaka
Keyword(s):  
Coupled Channel ◽  
Channel Systems

Observable effects of poles and shadow poles in coupled-channel systems

1989 ◽  
Vol 40 (2) ◽  
pp. 902-911 ◽  
Author(s):  
B. C. Pearce ◽  
B. F. Gibson
Keyword(s):  
Coupled Channel ◽  
Channel Systems

scholarly journals Lattice QCD studies on baryon interactions in the strangeness -2 sector with physical quark masses

2018 ◽  
Vol 175 ◽  
pp. 05010 ◽  
Author(s):  
Kenji Sasaki ◽  
Sinya Aoki ◽  
Takumi Doi ◽  
Shinya Gongyo ◽  
Tetsuo Hatsuda ◽  
...  
Keyword(s):  
Wave Function ◽  
Lattice Qcd ◽  
Lattice Volume ◽  
Quark Masses ◽  
H Dibaryon ◽  
Coupled Channel

We investigate baryon-baryon (BB) interactions in the strangeness S = −2 sector via the coupled-channel HAL QCD method which enables us to extract the scattering observables from Nambu-Bethe-Salpeter (NBS) wave function on the lattice. The simulations are performed with (almost) physical quark masses (mπ = 146MeV) and a huge lattice volume of La = 8.1fm. We discuss the fate of H-dibaryon state through the ΛΛ and NΞ coupled-channel scatterings

scholarly journals Supersymmetric transformations in coupled-channel systems

2000 ◽  
Vol 62 (6) ◽  
Author(s):  
H. Leeb ◽  
S. A. Sofianos ◽  
J.-M. Sparenberg ◽  
D. Baye
Keyword(s):  
Coupled Channel ◽  
Channel Systems

Analytic integration of contrast transfer functions

1988 ◽  
Vol 46 ◽  
pp. 822-823
Author(s):  
Peter Rez
Keyword(s):  
Wave Function ◽  
Transfer Function ◽  
Transfer Functions ◽  
Spherical Aberration ◽  
Continuous Distribution ◽  
Objective Lens ◽  
Direction Parallel ◽  
Scattering Angle ◽  
Analytic Integration ◽  
Image Position

In high resolution microscopy the image amplitude is given by the convolution of the specimen exit surface wave function and the microscope objective lens transfer function. This is usually done by multiplying the wave function and the transfer function in reciprocal space and integrating over the effective aperture. For very thin specimens the scattering can be represented by a weak phase object and the amplitude observed in the image plane is1where fe (Θ) is the electron scattering factor, r is a postition variable, Θ a scattering angle and x(Θ) the lens transfer function. x(Θ) is given by2where Cs is the objective lens spherical aberration coefficient, the wavelength, and f the defocus.We shall consider one dimensional scattering that might arise from a cross sectional specimen containing disordered planes of a heavy element stacked in a regular sequence among planes of lighter elements. In a direction parallel to the disordered planes there will be a continuous distribution of scattering angle.

Atomic Imaging of Crystals using Large-Angle Electron Scattering in STEM

1990 ◽  
Vol 48 (1) ◽  
pp. 74-75
Author(s):  
D.E. Jesson ◽  
S. J. Pennycook
Keyword(s):  
Wave Function ◽  
Electron Scattering ◽  
Numerical Solutions ◽  
Large Angle ◽  
Real Space ◽  
High Angle ◽  
Analytical Treatment ◽  
Order Zero ◽  
Experimental Conditions ◽  
Ewald Sphere

It is well known that conventional atomic resolution electron microscopy is a coherent imaging process best interpreted in reciprocal space using contrast transfer function theory. This is because the equivalent real space interpretation involving a convolution between the exit face wave function and the instrumental response is difficult to visualize. Furthermore, the crystal wave function is not simply related to the projected crystal potential, except under a very restrictive set of experimental conditions, making image simulation an essential part of image interpretation. In this paper we present a different conceptual approach to the atomic imaging of crystals based on incoherent imaging theory. Using a real-space analysis of electron scattering to a high-angle annular detector, it is shown how the STEM imaging process can be partitioned into components parallel and perpendicular to the relevant low index zone-axis.It has become customary to describe STEM imaging using the analytical treatment developed by Cowley. However, the convenient assumption of a phase object (which neglects the curvature of the Ewald sphere) fails rapidly for large scattering angles, even in very thin crystals. Thus, to avoid unpredictive numerical solutions, it would seem more appropriate to apply pseudo-kinematic theory to the treatment of the weak high angle signal. Diffraction to medium order zero-layer reflections is most important compared with thermal diffuse scattering in very thin crystals (<5nm). The electron wave function ψ(R,z) at a depth z and transverse coordinate R due to a phase aberrated surface probe function P(R-RO) located at RO is then well described by the channeling approximation;

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