scholarly journals Spatially varying electronic dephasing in three-dimensional topological insulators

2018 ◽  
Vol 98 (15) ◽  
Author(s):  
Abhishek Banerjee ◽  
Ananthesh Sundaresh ◽  
R. Ganesan ◽  
P. S. Anil Kumar
Keyword(s):  
Topological Insulators ◽  
Three Dimensional ◽  
Electronic Dephasing ◽  
Spatially Varying

scholarly journals Three-Dimensional Mirror Surface Measurement Based on Local Blur Analysis of Phase Measuring Deflectometry System

2020 ◽  
Vol 37 (5) ◽  
pp. 763-771
Author(s):  
Hongyu Sun ◽  
Le Wang ◽  
Zhan Song ◽  
Geng Chen
Keyword(s):  
Measurement Techniques ◽  
Three Dimensional ◽  
Block Matching ◽  
Surface Measurement ◽  
Mirror Surface ◽  
Reconstruction Accuracy ◽  
Surface Reflection ◽  
Block Matching Algorithm ◽  
Reflective Mirror ◽  
Spatially Varying

Despite the marked progress in recent years, structured light-based three-dimensional (3D) measurement techniques still have difficulty in capturing mirror surface reflection. The accuracy of 3D reconstruction for mirror objects should be further improved to adapt to the high reflectivity and curvature of such objects. To improve the stripe definition and reconstruction accuracy of highly reflective mirror objects, this paper analyzes the local blur of defocus stripes in phase measuring deflectometry (PMD) system, and presents a method to analyze the spatially varying defocusing and de-blurring, with the aid of a 3D block matching algorithm, thereby focusing on defocus stripes. Experimental results show that the proposed method can achieve micron-level reconstruction accuracy of standard flat mirrors, and detect the defects on highly reflective mirror objects at a high precision.

Polarimetric Three-Dimensional Topological Insulators/Organics Thin Film Heterojunction Photodetectors

ACS Nano ◽  
2019 ◽  
Vol 13 (9) ◽  
pp. 10810-10817 ◽  
Author(s):  
Ming Yang ◽  
Jun Wang ◽  
Yafei Zhao ◽  
Liang He ◽  
Chunhui Ji ◽  
...  
Keyword(s):  
Thin Film ◽  
Topological Insulators ◽  
Three Dimensional

scholarly journals Observation of Anderson Localization in Ultrathin Films of Three-Dimensional Topological Insulators

2015 ◽  
Vol 114 (21) ◽  
Author(s):  
Jian Liao ◽  
Yunbo Ou ◽  
Xiao Feng ◽  
Shuo Yang ◽  
Chaojing Lin ◽  
...  
Keyword(s):  
Ultrathin Films ◽  
Anderson Localization ◽  
Topological Insulators ◽  
Three Dimensional
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