Disorder-induced decoupled surface transport channels in thin films of doped topological insulators

2018 ◽  
Vol 98 (4) ◽  
Author(s):  
Hanbum Park ◽  
Jimin Chae ◽  
Kwangsik Jeong ◽  
Hyejin Choi ◽  
Jaehun Jeong ◽  
...  
2014 ◽  
Vol 113 (2) ◽  
Author(s):  
Matthew Brahlek ◽  
Nikesh Koirala ◽  
Maryam Salehi ◽  
Namrata Bansal ◽  
Seongshik Oh

2019 ◽  
Vol 100 (11) ◽  
Author(s):  
Raffaele Battilomo ◽  
Niccoló Scopigno ◽  
Carmine Ortix

2019 ◽  
pp. 361-391
Author(s):  
G. Padmalaya ◽  
E. Manikandan ◽  
S. Radha ◽  
B.S. Sreeja ◽  
P. Senthil Kumar

2011 ◽  
Vol 1344 ◽  
Author(s):  
M. Z. Hossain ◽  
S. L. Rumyantsev ◽  
K. M. F. Shahil ◽  
D. Teweldebrhan ◽  
M. Shur ◽  
...  

ABSTRACTWe report results of the study of the low-frequency noise in thin films of bismuth selenide topological insulators, which were mechanically exfoliated from bulk crystals via “graphene-like” procedures. From the resistance dependence on the film thickness, it was established that the surface conduction contributions to electron transport were dominant. It was found that the current fluctuations have the noise spectral density SI ∞ 1/f (where f is the frequency) for the frequency range up to 10 kHz. The obtained noise data are important for transport experiments with topological insulators and for any proposed device applications of these materials.


2014 ◽  
Vol 89 (12) ◽  
Author(s):  
A. A. Taskin ◽  
Fan Yang ◽  
Satoshi Sasaki ◽  
Kouji Segawa ◽  
Yoichi Ando

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