scholarly journals Tuning topology in thin films of topological insulators by strain gradients

2019 ◽  
Vol 100 (11) ◽  
Author(s):  
Raffaele Battilomo ◽  
Niccoló Scopigno ◽  
Carmine Ortix
Keyword(s):  
Thin Films ◽  
Topological Insulators ◽  
Strain Gradients

Disorder-induced decoupled surface transport channels in thin films of doped topological insulators

2018 ◽  
Vol 98 (4) ◽  
Author(s):  
Hanbum Park ◽  
Jimin Chae ◽  
Kwangsik Jeong ◽  
Hyejin Choi ◽  
Jaehun Jeong ◽  
...  
Keyword(s):  
Thin Films ◽  
Topological Insulators ◽  
Surface Transport ◽  
Transport Channels

Patterned 2D Thin Films Topological Insulators for Potential Plasmonic Applications

2019 ◽  
pp. 361-391
Author(s):  
G. Padmalaya ◽  
E. Manikandan ◽  
S. Radha ◽  
B.S. Sreeja ◽  
P. Senthil Kumar
Keyword(s):  
Thin Films ◽  
Topological Insulators

Low-Frequency Noise in “Graphene-Like” Exfoliated Thin Films of Topological Insulators

2011 ◽  
Vol 1344 ◽  
Author(s):  
M. Z. Hossain ◽  
S. L. Rumyantsev ◽  
K. M. F. Shahil ◽  
D. Teweldebrhan ◽  
M. Shur ◽  
...  
Keyword(s):  
Thin Films ◽  
Topological Insulators ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Bulk Crystals ◽  
Noise Spectral Density ◽  
Noise Data ◽  
Device Applications ◽  
Surface Conduction

ABSTRACTWe report results of the study of the low-frequency noise in thin films of bismuth selenide topological insulators, which were mechanically exfoliated from bulk crystals via “graphene-like” procedures. From the resistance dependence on the film thickness, it was established that the surface conduction contributions to electron transport were dominant. It was found that the current fluctuations have the noise spectral density SI ∞ 1/f (where f is the frequency) for the frequency range up to 10 kHz. The obtained noise data are important for transport experiments with topological insulators and for any proposed device applications of these materials.

scholarly journals Stress Gradients and Anisotropy in Thin Films

1988 ◽  
Vol 130 ◽  
Author(s):  
Robert M. Fisher ◽  
J. Z. Duan ◽  
Alan G. Fox
Keyword(s):  
Thin Films ◽  
Film Surface ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Thickness Strain ◽  
Strain Gradients ◽  
X Ray ◽  
Stress Gradients ◽  
Diffraction Peaks ◽  
Chromium Films

AbstractIndications that steep through-thickness strain gradients occur in vapour-deposited chromium films stemming from previous observations of film curling during spontaneous delamination from substrates, have been substantiated by analysis and simulation of Bragg X-Ray diffraction peaks. The presence of large through-thickness compressive strains, that increase quadratically with distance from the substrate from about zero at the interface to around 0.8% at the film surface, was deduced by empirical computer matching of diffraction peak shapes.

Strain gradients in Cu–Fe thin films and multilayers during micropillar compression

2016 ◽  
Vol 651 ◽  
pp. 146-154 ◽  
Author(s):  
Jiangting Wang ◽  
Chunhui Yang ◽  
Peter D. Hodgson
Keyword(s):  
Thin Films ◽  
Strain Gradients ◽  
Micropillar Compression
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