scholarly journals Electric manipulation of the Mn-acceptor binding energy and the Mn-Mn exchange interaction on the GaAs (110) surface by nearby As vacancies

2015 ◽  
Vol 92 (4) ◽  
Author(s):  
M. R. Mahani ◽  
A. H. MacDonald ◽  
C. M. Canali
2016 ◽  
pp. 4024-4028 ◽  
Author(s):  
Sergey I. Pokutnyi ◽  
Wlodzimierz Salejda

The possibility of occurrence of the excitonic  quasimolecule formed of spatially separated electrons and holes in a nanosystem that consists  of  CuO quantum dots synthesized in a silicate glass matrix. It is shown that the major contribution to the excitonic quasimolecule binding energy is made by the energy of the exchange interaction of electrons with holes and this contribution is much more substantial than the contribution of the energy of Coulomb interaction between the electrons and holes.


2016 ◽  
Vol 12 (2) ◽  
pp. 4018-4022
Author(s):  
Sergey I.Pokutnyi ◽  
Wlodzimierz Salejda

The possibility of occurrence of the excitonic  quasimolecule formed of spatially separated electrons and holes in a nanosystem that consists  of  CuO quantum dots synthesized in a silicate glass matrix. It is shown that the major contribution to the excitonic quasimolecule binding energy is made by the energy of the exchange interaction of electrons with holes and this contribution is much more substantial than the contribution of the energy of Coulomb interaction between the electrons and holes.


2008 ◽  
Vol 93 (14) ◽  
pp. 141104 ◽  
Author(s):  
A. Sedhain ◽  
T. M. Al Tahtamouni ◽  
J. Li ◽  
J. Y. Lin ◽  
H. X. Jiang

2002 ◽  
Vol 92 (10) ◽  
pp. 6039-6042 ◽  
Author(s):  
W. M. Zheng ◽  
M. P. Halsall ◽  
P. Harmer ◽  
P. Harrison ◽  
M. J. Steer

1994 ◽  
Vol 339 ◽  
Author(s):  
Yoshihiro Ueta ◽  
Shiro Sakai ◽  
Yasushi Kamiya ◽  
Hisao Sato

ABSTRACTThe acceptor binding energy is calculated to find out the best acceptor impurity in InN, GaN and AlN. Be is predicted to be the shallowest acceptor and the next are Mg and Zn. Group IV elements such as C or Si are very deep. Band lineup is calculated to be ΔEc : ΔEv = 2.1 eV : 0.76 eV = 0.73 : 0.27 = 2.8 : 1 for GaN/AlN and ΔEc : ΔEv = 0.88 eV : 0.66 eV = 0.57 : 0.43 = 1.3 : 1 for GaN/InN. GaN is grown on GaAs and GaP-coated Si substrate by MOCVD. GaAs intermediate layer gives better GaN compared to GaP intermediate layer. It is suggested that the lower bulk modulus of GaAs than that of GaP gives this difference.


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