scholarly journals Polaron-ion correlations inLixFePO4studied by x-ray nuclear resonant forward scattering at elevated pressure and temperature

2014 ◽  
Vol 90 (9) ◽  
Author(s):  
S. J. Tracy ◽  
L. Mauger ◽  
H. J. Tan ◽  
J. A. Muñoz ◽  
Yuming Xiao ◽  
...  
Keyword(s):  
Elevated Pressure ◽  
Forward Scattering ◽  
X Ray ◽  
Nuclear Resonant Forward Scattering

scholarly journals In situ observation of phase changes of a silica-supported cobalt catalyst for the Fischer–Tropsch process by the development of a synchrotron-compatible in situ/operando powder X-ray diffraction cell

2018 ◽  
Vol 25 (6) ◽  
pp. 1673-1682 ◽  
Author(s):  
Adam S. Hoffman ◽  
Joseph A. Singh ◽  
Stacey F. Bent ◽  
Simon R. Bare
Keyword(s):  
High Pressure ◽  
Elevated Pressure ◽  
Phase Changes ◽  
In Situ Observation ◽  
X Ray Diffraction ◽  
Fischer Tropsch ◽  
X Ray ◽  
And Performance ◽  
Co Nanoparticles

In situ characterization of catalysts gives direct insight into the working state of the material. Here, the design and performance characteristics of a universal in situ synchrotron-compatible X-ray diffraction cell capable of operation at high temperature and high pressure, 1373 K, and 35 bar, respectively, are reported. Its performance is demonstrated by characterizing a cobalt-based catalyst used in a prototypical high-pressure catalytic reaction, the Fischer–Tropsch synthesis, using X-ray diffraction. Cobalt nanoparticles supported on silica were studied in situ during Fischer–Tropsch catalysis using syngas, H2 and CO, at 723 K and 20 bar. Post reaction, the Co nanoparticles were carburized at elevated pressure, demonstrating an increased rate of carburization compared with atmospheric studies.

Short‐range order in submonolayer Ni on GaAs(110) by x‐ray photoelectron forward scattering

1988 ◽  
Vol 6 (3) ◽  
pp. 1495-1498 ◽  
Author(s):  
W. F. Egelhoff ◽  
D. A. Steigerwald ◽  
J. E. Rowe ◽  
T. D. Bussing
Keyword(s):  
Short Range ◽  
Short Range Order ◽  
Forward Scattering ◽  
Range Order ◽  
X Ray

Structural Characterization of Thin Metal Overlayers by X-ray Photoelectron and Auger-Electron Forward Scattering

1986 ◽  
Vol 83 ◽  
Author(s):  
W. F. Egelhoff
Keyword(s):  
Ultrathin Films ◽  
Surface Segregation ◽  
Metal Films ◽  
Epitaxial Films ◽  
Forward Scattering ◽  
Crystalline Lattice ◽  
Auger Electrons ◽  
X Ray ◽  
Metal Overlayers

ABSTRACTForward scattering of XPS and Auger electrons by atoms in a crystalline lattice produce beams of enhanced intensity radiating out from the surface at angles corresponding to the internuclear axes present in the top few atomic layers. This effect has been applied to analyze the mechanism of surface segregation in ultrathin metal films, to analyze the interdiffusion at the interfaces of ultrathin films, and to assess the effects of substrate contamination on the growth of epitaxial films. The systems studied in this work are Cu, Ni, and Co on Ni(100), however the purpose of this work is not to investigate these particular systems but to use them to illustrate the capabilities of forward scattering.

The X-ray forward scattering coefficient of water

1969 ◽  
Vol 25 (4) ◽  
pp. 564-568 ◽  
Author(s):  
N. J. Chonacky ◽  
W. W. Beeman
Keyword(s):  
Forward Scattering ◽  
Scattering Coefficient ◽  
X Ray

Effect of finite spatial coherence length on small-angle scattering

2015 ◽  
Vol 48 (6) ◽  
pp. 1660-1664 ◽  
Author(s):  
Yuya Shinohara ◽  
Yoshiyuki Amemiya
Keyword(s):  
Small Angle ◽  
Coherence Length ◽  
Spatial Coherence ◽  
Small Angle Scattering ◽  
Forward Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Imaging ◽  
Angle Scattering ◽  
Diffraction Imaging

This study shows that forward scattering at the origin of reciprocal space contributes to the scattering intensity profiles of ultra-small-angle scattering. The forward scattering corresponds to a Fourier transform of the X-ray coherent volume on a sample. This contribution is usually ignored in the study of small-angle scattering, while it is fully considered in the fields of X-ray imaging, such as coherent X-ray diffraction imaging and X-ray ptychography. This effect is explicitly illustrated in the context of small-angle scattering, and the effect of a finite spatial coherence length on small-angle scattering is discussed.

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