Characteristic-energy-loss spectra of vanadium and ofV2O3

1974 ◽  
Vol 9 (8) ◽  
pp. 3369-3376 ◽  
Author(s):  
F. J. Szalkowski ◽  
P. A. Bertrand ◽  
G. A. Somorjai
Keyword(s):  
Energy Loss ◽  
Characteristic Energy

Background Fitting in the Low-Loss Region of Electron Energy Loss Spectra

1990 ◽  
Vol 48 (2) ◽  
pp. 56-57
Author(s):  
C P Scott ◽  
A J Craven ◽  
C J Gilmore ◽  
A W Bowen
Keyword(s):  
Energy Loss ◽  
Multiple Scattering ◽  
Simple Form ◽  
Single Scattering ◽  
Low Loss ◽  
Characteristic Energy ◽  
Normal Method ◽  
Fitting In ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

The normal method of background subtraction in quantitative EELS analysis involves fitting an expression of the form I=AE-r to an energy window preceding the edge of interest; E is energy loss, A and r are fitting parameters. The calculated fit is then extrapolated under the edge, allowing the required signal to be extracted. In the case where the characteristic energy loss is small (E < 100eV), the background does not approximate to this simple form. One cause of this is multiple scattering. Even if the effects of multiple scattering are removed by deconvolution, it is not clear that the background from the recovered single scattering distribution follows this simple form, and, in any case, deconvolution can introduce artefacts.The above difficulties are particularly severe in the case of Al-Li alloys, where the Li K edge at ~52eV overlaps the Al L2,3 edge at ~72eV, and sharp plasmon peaks occur at intervals of ~15eV in the low loss region. An alternative background fitting technique, based on the work of Zanchi et al, has been tested on spectra taken from pure Al films, with a view to extending the analysis to Al-Li alloys.

The form of characteristic energy-loss spectra

1969 ◽  
Vol 8 (12) ◽  
pp. 1012-1020
Author(s):  
M. I. Korsunskii ◽  
Ya. E. Genkin
Keyword(s):  
Energy Loss ◽  
Characteristic Energy

scholarly journals Characteristic energy loss of electrons in Mg with angle resolution

2020 ◽  
Vol 1 (1) ◽  
pp. 4-9
Author(s):  
Iosif I. Khinich ◽  
Vladimir P. Pronin
Keyword(s):  
Energy Loss ◽  
Characteristic Energy

Energy Loss Imaging in Biology

1982 ◽  
Vol 40 ◽  
pp. 416-419
Author(s):  
H. Shuman ◽  
A.V. Somlyo ◽  
A.P. Somlyo ◽  
T. Frey ◽  
D. Safer
Keyword(s):  
Electron Microscope ◽  
Energy Loss ◽  
Cross Section ◽  
Cross Sections ◽  
Count Rate ◽  
Electron Flux ◽  
Characteristic Energy ◽  
Spectrometer Slit ◽  
Electron Energy Loss ◽  
Sensitive Method

It has been recognized for sometime that electron energy loss spectroscopy (EELS) is potentially the most sensitive method of measuring elemental composition in the electron microscope. Magnetic sector spectrometers currently in use collect most of the inelastically scattered electrons, while the cross sections for ionization of the L2 3 levels of the biologically important elements are large. The energies of the theoretically predicted L2 3 absorption edge maxima and their corresponding differential cross section for lOmrad collection and 80keV incident electrons are shown in Table I. The characteristic energy loss electron count rate expected from one atom with lOeV spectrometer slit width and lOOA/cm2 (the maximum available from a tungsten hairpin) electron flux at the specimen, indicates that the minimum detectable mass sensitivity of EELS will be high. An experimentally determined count rate and cross section for the Fe M2, 3 edge was determined from the ferritin images shown in Fig. 1.

On the problem of filtered images in chemical analysis

1978 ◽  
Vol 36 (1) ◽  
pp. 538-539
Author(s):  
G. Zanchi ◽  
J. Sevely ◽  
B. Jouffrey
Keyword(s):  
Chemical Analysis ◽  
Energy Loss ◽  
High Spatial Resolution ◽  
Energy Losses ◽  
List Type ◽  
Characteristic Energy ◽  
X Ray ◽  
Energy Filtering ◽  
Imaging Properties ◽  
Loss Range

As was proposed in several recent review papers (for instance 1-3) it is interesting to use electron energy losses corresponding to inner shell excitations by incident electrons to perform chemical analysis. One of the main advantages of the inner shell excitation spectroscopy (ISES) is that it is essentially available for light elements, contrary to characteristic X ray emission spectroscopy.Two methods can be used :- energy analysis : energy loss spectra are obtained from selected projected area of the sample and elemental characteristic energy losses are detected;- image energy filtering : images are formed by selecting electrons in an energy loss range which contains a characteristic energy loss. They show a map of the distribution of a given element in the object with a high spatial resolution.Combining these two methods is quite essential to perform chemical analysis. Such studies can be achieved in CTEM by means of an energy filtering system preserving the imaging properties of the microscope.

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