scholarly journals Calculation of divergent photon absorption in ultrathin films of a topological insulator

2013 ◽  
Vol 88 (19) ◽  
Author(s):  
Jing Wang ◽  
Hideo Mabuchi ◽  
Xiao-Liang Qi
Nano Research ◽  
2010 ◽  
Vol 3 (12) ◽  
pp. 874-880 ◽  
Author(s):  
Guang Wang ◽  
Xiegang Zhu ◽  
Jing Wen ◽  
Xi Chen ◽  
Ke He ◽  
...  

Nano Letters ◽  
2011 ◽  
Vol 11 (7) ◽  
pp. 2601-2605 ◽  
Author(s):  
Hongtao Yuan ◽  
Hongwen Liu ◽  
Hidekazu Shimotani ◽  
Hua Guo ◽  
Mingwei Chen ◽  
...  

Nanoscale ◽  
2014 ◽  
Vol 6 (6) ◽  
pp. 3127 ◽  
Author(s):  
H. Li ◽  
J. M. Shao ◽  
H. B. Zhang ◽  
G. W. Yang

2019 ◽  
Vol 7 (23) ◽  
pp. 7027-7034 ◽  
Author(s):  
Junpeng Qiao ◽  
Meng-Yuan Chuang ◽  
Jia-Chi Lan ◽  
Yuan-Yao Lin ◽  
Wei-Heng Sung ◽  
...  

In this study, strong two-photon absorption (TPA) in a layered bismuth telluride (Bi2Te3) topological insulator (TI) is observed and investigated by the Z-scan method under excitation with a femtosecond laser pulse at a wavelength of 1056 nm.


2017 ◽  
Vol 122 (7) ◽  
pp. 073903 ◽  
Author(s):  
Zhuo Bin Siu ◽  
Cong Son Ho ◽  
Seng Ghee Tan ◽  
Mansoor B. A. Jalil

Author(s):  
Yoshichika Bando ◽  
Takahito Terashima ◽  
Kenji Iijima ◽  
Kazunuki Yamamoto ◽  
Kazuto Hirata ◽  
...  

The high quality thin films of high-Tc superconducting oxide are necessary for elucidating the superconducting mechanism and for device application. The recent trend in the preparation of high-Tc films has been toward “in-situ” growth of the superconducting phase at relatively low temperatures. The purpose of “in-situ” growth is to attain surface smoothness suitable for fabricating film devices but also to obtain high quality film. We present the investigation on the initial growth manner of YBCO by in-situ reflective high energy electron diffraction (RHEED) technique and on the structural and superconducting properties of the resulting ultrathin films below 100Å. The epitaxial films have been grown on (100) plane of MgO and SrTiO, heated below 650°C by activated reactive evaporation. The in-situ RHEED observation and the intensity measurement was carried out during deposition of YBCO on the substrate at 650°C. The deposition rate was 0.8Å/s. Fig. 1 shows the RHEED patterns at every stage of deposition of YBCO on MgO(100). All the patterns exhibit the sharp streaks, indicating that the film surface is atomically smooth and the growth manner is layer-by-layer.


1996 ◽  
Vol 43 (9) ◽  
pp. 1765-1771 ◽  
Author(s):  
M. W. HAMILTON and D. S. ELLIOTT

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