Transition energies and direct-indirect band gap crossing in zinc-blende AlxGa1−xN

2013 ◽  
Vol 87 (19) ◽  
Author(s):  
M. Landmann ◽  
E. Rauls ◽  
W. G. Schmidt ◽  
Marcus Röppischer ◽  
Christoph Cobet ◽  
...  
1988 ◽  
Vol 144 ◽  
Author(s):  
G. S. Solomon ◽  
J. B. Posthill ◽  
M. L. Timmons

ABSTRACTEpitaxial single crystal (001) chalcopyrite-structure ZnGeAs2 and single crystal (100) zinc blende-structure (ZnGeAs2)xGe1−x alloys have been grown by organometallic vapor phase epitaxy on (100) GaAs. Selected area electron diffraction was used to determine the crystal structure for several Zn:Ge molar flow ratios. Bulk chemical composition was determined by electron microprobe and correlated to crystal lattice constants obtained from x-ray diffraction. Due to the lattice mismatch between chalcopyrite-structure ZnGeAs2 and the GaAs substrate, the epitaxy is elastically strained, compressing the a-lattice constant and elongating the c-lattice constant. Optical absorption and transmission spectroscopy indicate the zinc-blende-structure material has an indirect band gap of approximately 0.6 eV, whereas the chalcopyrite ZnGeAs2 has a direct band gap of 1.15 eV. Secondary ion mass spectroscopy reveals significant Zn diffusion into the GaAs substrate if the Zn:Ge molar flow ratio exceeds the ratio required for stoichiometric chalcopyrite-structure crystal growth.


Electronics ◽  
2021 ◽  
Vol 10 (9) ◽  
pp. 988
Author(s):  
Chrysa Aivalioti ◽  
Alexandros Papadakis ◽  
Emmanouil Manidakis ◽  
Maria Kayambaki ◽  
Maria Androulidaki ◽  
...  

Nickel oxide (NiO) is a p-type oxide and nitrogen is one of the dopants used for modifying its properties. Until now, nitrogen-doped NiO has shown inferior optical and electrical properties than those of pure NiO. In this work, we present nitrogen-doped NiO (NiO:N) thin films with enhanced properties compared to those of the undoped NiO thin film. The NiO:N films were grown at room temperature by sputtering using a plasma containing 50% Ar and 50% (O2 + N2) gases. The undoped NiO film was oxygen-rich, single-phase cubic NiO, having a transmittance of less than 20%. Upon doping with nitrogen, the films became more transparent (around 65%), had a wide direct band gap (up to 3.67 eV) and showed clear evidence of indirect band gap, 2.50–2.72 eV, depending on %(O2-N2) in plasma. The changes in the properties of the films such as structural disorder, energy band gap, Urbach states and resistivity were correlated with the incorporation of nitrogen in their structure. The optimum NiO:N film was used to form a diode with spin-coated, mesoporous on top of a compact, TiO2 film. The hybrid NiO:N/TiO2 heterojunction was transparent showing good output characteristics, as deduced using both I-V and Cheung’s methods, which were further improved upon thermal treatment. Transparent NiO:N films can be realized for all-oxide flexible optoelectronic devices.


2021 ◽  
Author(s):  
Mingming Jiang ◽  
Yang Liu ◽  
Ruiming Dai ◽  
Kai Tang ◽  
Peng Wan ◽  
...  

Suffering from the indirect band gap, low carrier mobility, and large lattice mismatch with other semiconductor materials, one of the current challenges in Si-based materials and structures is to prepare...


2013 ◽  
Vol 652-654 ◽  
pp. 527-531 ◽  
Author(s):  
A.N. Alias ◽  
T.I. Tunku Kudin ◽  
Z.M. Zabidi ◽  
M.K. Harun ◽  
Ab Malik Marwan Ali ◽  
...  

The optical absorption spectra of blended poly (N-carbazole) (PVK) with polyvinylpyrrolidone (PVP) in various compositions are investigated. A doctor blade technique was used to coat the blended polymer on a quartz substrate. The electronic parameters such as absorption edge (Ee), allowed direct band gap (Ed), allowed indirect band gap (Ei), Urbach edge (Eu) and steepness parameter (γ) were calculated using Tauc/Davis-Mott Model. The results reveal that the Ee, Ed and Ei increase with increasing of PVP ratio. There also have variation changing in Urbach energy and steepness parameter.


2013 ◽  
Vol 6 (7) ◽  
pp. 071201 ◽  
Author(s):  
Daniel A. Beaton ◽  
Kirstin Alberi ◽  
Brian Fluegel ◽  
Angelo Mascarenhas ◽  
John L. Reno

2014 ◽  
Vol 25 (13) ◽  
pp. 135703 ◽  
Author(s):  
J S Colton ◽  
S D Erickson ◽  
T J Smith ◽  
R K Watt

1995 ◽  
Vol 78 (8) ◽  
pp. 5090-5097 ◽  
Author(s):  
G. Torres‐Delgado ◽  
R. Castanedo‐Perez ◽  
P. Diaz‐Arencibia ◽  
J. G. Mendoza‐Alvarez ◽  
J. L. Orozco‐Vilchis ◽  
...  

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