Probe-rotating atomic force microscopy for determining material properties

2014 ◽  
Vol 85 (3) ◽  
pp. 033708 ◽  
Soft Matter ◽  
2018 ◽  
Vol 14 (1) ◽  
pp. 140-150 ◽  
Author(s):  
Christian Ganser ◽  
Caterina Czibula ◽  
Daniel Tscharnuter ◽  
Thomas Schöberl ◽  
Christian Teichert ◽  
...  

We present an atomic force microscopy based method to study viscoelastic material properties at low indentation depths with non-negligible adhesion and surface roughness.


2012 ◽  
Vol 85 (19) ◽  
Author(s):  
Daniel Forchheimer ◽  
Daniel Platz ◽  
Erik A. Tholén ◽  
David B. Haviland

Author(s):  
Wei Huang ◽  
Andrew J. Dick

Due to the intrinsic nonlinearity of the tip-sample interaction forces that are utilized in atomic force microscopy, nonlinear behavior can be observed even under the most ‘ideal’ conditions. While the standard operating modes of the atomic force microscope (AFM) have been developed to minimize this nonlinear behavior, the authors’ work focuses on utilizing a nonlinear response of the AFM probe associated with off-resonance excitation in order to measure local material properties of the sample. Previously, period-doubling bifurcations were identified and studied for an off-resonance excitation condition of two-and-a-half times the fundamental frequency. A relationship was identified between the characteristics of the qualitative response transition and the properties of the probe and sample. For a given probe, the critical separation distance where the period-doubling bifurcation occurs is influenced by the local modulus properties of the sample. This paper details the current effort studying this relationship with the goal of developing a new AFM operation mode for obtaining localized material properties by scanning the sample. The influence of different system parameters on this relationship is studied and preliminary simulation results are presented for a simple scanning process.


Soft Matter ◽  
2019 ◽  
Vol 15 (8) ◽  
pp. 1721-1729 ◽  
Author(s):  
Nicolas Schierbaum ◽  
Johannes Rheinlaender ◽  
Tilman E. Schäffer

Combined AFM with TFM is a powerful tool to simultaneously and directly measure “passive” viscoelastic material properties and “active” contractile prestress of living cells at the nanoscale.


Nanoscale ◽  
2013 ◽  
Vol 5 (11) ◽  
pp. 4729 ◽  
Author(s):  
Alexander Cartagena ◽  
Mercedes Hernando-Pérez ◽  
José L. Carrascosa ◽  
Pedro J. de Pablo ◽  
Arvind Raman

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