scholarly journals Molecular orientation in soft matter thin films studied by resonant soft x-ray reflectivity

2011 ◽  
Vol 83 (15) ◽  
Author(s):  
Markus Mezger ◽  
Blandine Jérôme ◽  
Jeffrey B. Kortright ◽  
Manuel Valvidares ◽  
Eric M. Gullikson ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
Soft Matter ◽  
X Ray

Origins of polarization-dependent anisotropic X-ray scattering from organic thin films

2016 ◽  
Vol 23 (1) ◽  
pp. 219-227 ◽  
Author(s):  
Eliot Gann ◽  
Brian A. Collins ◽  
Maolong Tang ◽  
John R. Tumbleston ◽  
Subrangsu Mukherjee ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
Organic Thin Films ◽  
Anisotropic Scattering ◽  
Isotropic Scattering ◽  
X Rays ◽  
General Measure ◽  
X Ray ◽  
X Ray Scattering ◽  
Local Correlations

Organic thin films that have no overall in-plane directional ordering often nonetheless produce anisotropic scattering patterns that rotate with the polarization of incident resonant X-rays. Isotropic symmetry is broken by local correlations between molecular orientation and domain structure. Such examples of molecular alignment at domain interfaces and within the bulk of domains, which are both critical to fields such as organic electronics, are simulated and compared with experimental scattering. Anisotropic scattering patterns are found to allow unambiguous identification of the mechanism of local molecular orientation correlations and, as such, promise to be both distinct and complementary to isotropic scattering intensity as a general measure of thin film microstructure.

Molecular orientation in single crystal thin films of N-(4-nitrophenyl)-(L)-prolinol

1998 ◽  
Vol 13 (1) ◽  
pp. 131-134 ◽  
Author(s):  
Ligui Zhou ◽  
M. Thakur
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Single Crystal ◽  
Molecular Orientation ◽  
Second Harmonic ◽  
Substrate Surface ◽  
X Ray Diffraction ◽  
X Ray ◽  
Single Crystal Films ◽  
Crystal Films

Thin single crystal films of N-(4-nitrophenyl)-(L)-prolinol (NPP) were prepared using the modified shear method. The surface orientation of the single crystal films was determined by x-ray diffraction and was found to be [101]. Polarized microscopy showed uniform birefringence and complete extinction when the thin film was rotated under crossed polarization, implying single crystal thin films with uniform surface were obtained. The molecular orientation in the NPP thin film was studied by polarized UV-visible and polarized micro-FTIR spectroscopy along with x-ray diffraction. The orientation of the NPP molecules was found to be almost parallel to the plane of the film. This parallel orientation is because of the polar (hydrogen bonding) interaction of the −(OH) and the N=O groups of the NPP molecule with the hydrophilic substrate surface. The results of the second harmonic generation (SHG) measurements are consistent with such a molecular orientation. These results show that the final molecular and crystallographic orientation in the film is determined by its initial molecule-substrate interaction.

ESR and X-ray diffraction studies on thin films of poly-3-hexylthiophene: Molecular orientation and magnetic interactions

2008 ◽  
Vol 516 (9) ◽  
pp. 2691-2694 ◽  
Author(s):  
Keisuke Sugiyama ◽  
Takashi Kojima ◽  
Hisashi Fukuda ◽  
Hisashi Yashiro ◽  
Toshihiko Matsuura ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Orientation ◽  
Magnetic Interactions ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Linearly Polarized UV Light-Induced Optical Anisotropy of PVA Films and Flexible Macrocycle Schiff Base Ni(II), Cu(II), Zn(II) Dinuclear Complexes

Symmetry ◽  
2018 ◽  
Vol 10 (12) ◽  
pp. 760
Author(s):  
Masahiro Takase ◽  
Shiomi Yagi ◽  
Tomoyuki Haraguchi ◽  
Shabana Noor ◽  
Takashiro Akitsu
Keyword(s):  
Optical Anisotropy ◽  
Molecular Orientation ◽  
Soft Matter ◽  
Uv Light ◽  
Polarized Light ◽  
X Ray ◽  
Crystallographic Symmetry ◽  
Linearly Polarized ◽  
Dinuclear Metal Complexes ◽  
Crystal Structural

Three dinuclear metal complexes (comprised of six-coordinated nNi2L and five-coordinated nCu2L and nZn2L) were confirmed by means of elemental analysis, UV-vis and IR spectra, and single X-ray crystal structural analysis in a spectroscopic study. The stable structures of these nNi2L, nCu2L, and nZn2L complexes in poly(vinylalcohol) (PVA) films were analyzed using UV-vis spectra. The molecular orientation of hybrid PVA film materials after linearly polarized light irradiation was analyzed to obtain the polarized spectra and dichroic ratio. Among the three materials, nNi2L and nZn2L complexes indicated an increasing optical anisotropy that depended on the flexibility of the complexes. We have included a discussion on the formation of the pseudo-crystallographic symmetry of the components in a soft matter (PVA films).

Interfacial Properties of Soft Matter Thin Films Studied by X-ray Reflectivity

2000 ◽  
pp. 129-142 ◽  
Author(s):  
O. H. Seeck ◽  
I. D. Kaendler ◽  
D. Shu ◽  
Hyunjung Kim ◽  
K. Shin ◽  
...  
Keyword(s):  
Thin Films ◽  
Soft Matter ◽  
Interfacial Properties ◽  
X Ray

The Precipitation of Si in AlCuSi Thin Films

1973 ◽  
Vol 31 ◽  
pp. 34-35 ◽  
Author(s):  
R. M. Anderson
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Heat Treatment ◽  
Solid Solution ◽  
Integrated Circuit ◽  
Copper Film ◽  
Solution Concentration ◽  
X Ray ◽  
Silicon Thin Films ◽  
Before And After

Aluminum-copper-silicon thin films have been considered as an interconnection metallurgy for integrated circuit applications. Various schemes have been proposed to incorporate small percent-ages of silicon into films that typically contain two to five percent copper. We undertook a study of the total effect of silicon on the aluminum copper film as revealed by transmission electron microscopy, scanning electron microscopy, x-ray diffraction and ion microprobe techniques as a function of the various deposition methods.X-ray investigations noted a change in solid solution concentration as a function of Si content before and after heat-treatment. The amount of solid solution in the Al increased with heat-treatment for films with ≥2% silicon and decreased for films <2% silicon.

Sign in / Sign up

Export Citation Format

Share Document