X-ray diffraction and infrared multiple-angle incidence resolution spectroscopic studies on the crystal structure and molecular orientation of zinc-porphyrin thin films on a SiO2/Si substrate

2009 ◽  
Vol 105 (11) ◽  
pp. 113529 ◽  
Author(s):  
S. Ryuzaki ◽  
T. Hasegawa ◽  
J. Onoe
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Molecular Orientation ◽  
Spectroscopic Studies ◽  
X Ray Diffraction ◽  
Si Substrate ◽  
Zinc Porphyrin ◽  
X Ray

Electrical Properties of Multilayer Synthesized CuInSi Thin Film

2011 ◽  
Vol 383-390 ◽  
pp. 822-825
Author(s):  
Ping Luan ◽  
Jian Sheng Xie ◽  
Jin Hua Li
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Thin Films ◽  
Electrical Properties ◽  
Annealing Temperature ◽  
Time Effect ◽  
X Ray Diffraction ◽  
Testing Instrument ◽  
X Ray ◽  
Conductivity Type

Using magnetron sputtering technology, the CuInSi thin films were prepared by multilayer synthesized method. The structure of CuInSi films were detected by X-ray diffraction(XRD), the main crystal phase peak is at 2θ=42.458°; The resistivity of films were measured by SDY-4 four-probe meter; The conductive type of the films were tested by DLY-2 conductivity type testing instrument. The results show that the annealing temperature and time effect on the crystal resistivity and crystal structure greatly.

Obtaining the structure factors for an epitaxial film using Cu X-ray radiation

2013 ◽  
Vol 46 (6) ◽  
pp. 1749-1754 ◽  
Author(s):  
P. Wadley ◽  
A. Crespi ◽  
J. Gázquez ◽  
M.A. Roldán ◽  
P. García ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Structure Factor ◽  
Tetragonal Symmetry ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Structure Factors ◽  
Scanning Transmission

Determining atomic positions in thin films by X-ray diffraction is, at present, a task reserved for synchrotron facilities. Here an experimental method is presented which enables the determination of the structure factor amplitudes of thin films using laboratory-based equipment (Cu Kα radiation). This method was tested using an epitaxial 130 nm film of CuMnAs grown on top of a GaAs substrate, which unlike the orthorhombic bulk phase forms a crystal structure with tetragonal symmetry. From the set of structure factor moduli obtained by applying this method, the solution and refinement of the crystal structure of the film has been possible. The results are supported by consistent high-resolution scanning transmission electron microscopy and stoichiometry analyses.

Lattice parameters and optical absorption of CuIn1-xGaxSe2 thin films

1999 ◽  
Vol 77 (7) ◽  
pp. 515-520
Author(s):  
AAI Al-Bassam
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Thin Films ◽  
Grain Size ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Cubic Structure ◽  
Ga Content

Thin film polycrystalline solar cells based on CuIn1–xGaxSe2 have been fabricated and studied with x values from 0 to 1.0. The lattice parameters, grain size, and band gap were measured. Crystal structure and X-ray data of CuIn1–xGaxSe2 were determined using X-ray diffractometry. These materials had a cubic structure with x ≥ 0.5 and a tetragonal structure with x ≤ 0.5. The lattice constants vary linearly with composition. Grain size was measured using X-ray diffraction where the grain size increased linearly with Ga content. A grain size of 1.83-3.52 μm was observed with x ≤ 0.5, while it increased to 4.53 μm for x = 0.58.PACS No.: 70.73

Structural characterization of sputter-deposited LaNiO3 thin films on Si substrate by x-ray reflectivity and diffraction

1997 ◽  
Vol 12 (11) ◽  
pp. 3165-3173 ◽  
Author(s):  
Hsin-Yi Lee ◽  
Tai-Bor Wu
Keyword(s):  
Thin Films ◽  
Transition Layer ◽  
Mass Density ◽  
Composition Analysis ◽  
X Ray Diffraction ◽  
Diffraction Intensity ◽  
Si Substrate ◽  
X Ray ◽  
Sputter Deposited ◽  
Reflectivity Data

X-ray reflectivity and diffraction were applied to characterize the highly (100)-textured thin films of LaNiO3, which were deposited on Si substrate via radio frequency magnetron sputtering at temperatures ranging from 250 to 450 °C. Two interference fringes of different period were observed from the reflectivity curves, and the fitting result indicates that in addition to the normal lanthanum-nickel oxide layer, a transition layer, which has a larger mass density than the previous one, exists in the sputter-deposited films. A comparison of the measured x-ray diffraction intensity with that calculated from layer thickness and mass density obtained from reflectivity data indicates that the transition layer is noncrystalline. The x-ray diffraction result also shows that there is a significant decrease of (100) diffraction intensity relative to that of (200) as increasing the deposition temperature. Using the reflectivity and diffraction data along with results of electron diffraction and film composition analysis from our other studies, such a change of relative intensity between the two diffraction peaks is attributed to the increasing content of two also highly textured La-rich phases, i.e., (110)-textured La4Ni3O10 and (100)-textured La2NiO4, in addition to the LaNiO3.

Crystal structure of oligothiophene thin films characterized by two-dimensional grazing incidence X-ray diffraction

2013 ◽  
Vol 53 (1S) ◽  
pp. 01AD01 ◽  
Author(s):  
Takeshi Watanabe ◽  
Tomoyuki Koganezawa ◽  
Mamoru Kikuchi ◽  
Christine Videlot-Ackermann ◽  
Jörg Ackermann ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Grazing Incidence ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray

Synthesis of Zn1–xMgxO and its structural characterization

2001 ◽  
Vol 16 (4) ◽  
pp. 903-906 ◽  
Author(s):  
M. S. Tomar ◽  
R. Melgarejo ◽  
P. S. Dobal ◽  
R. S. Katiyar
Keyword(s):  
Crystal Structure ◽  
Spin Coating ◽  
Optoelectronic Devices ◽  
Spectroscopic Studies ◽  
Structural Behavior ◽  
Material System ◽  
X Ray Diffraction ◽  
X Ray ◽  
Raman Spectroscopic ◽  
Mg Substitution

Zn1–xMgxO is an important material for optoelectronic devices. We synthesized this material using a solution-based route. We investigated in detail the structural behavior of this material system using x-ray diffraction and Raman spectroscopy. Mg substitution up to x ≈ 0.10 does not change the crystal structure, as revealed by x-ray diffraction and Raman spectroscopic studies. This synthesis route is also suitable to prepare thin films by spin coating with the possibility of p and n doping.

scholarly journals Synthesis, Crystal Structure and IR Spectrum studies of 2-(4-Methyl-2-phenyl-4,5-dihydro-oxazol-4-ylmethyl)- isoindole-1,3-dione

2019 ◽  
Vol 9 (2) ◽  
pp. 116-124 ◽  
Author(s):  
Alami Anouar ◽  
Khadim Dioukhane ◽  
Younas Aouine ◽  
Mohamed El Omari ◽  
Lahcen El Ammari ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Least Squares Method ◽  
Spectroscopic Studies ◽  
Amino Compound ◽  
X Ray Diffraction ◽  
Unit Cell Parameters ◽  
Monoclinic System ◽  
X Ray ◽  
Cell Parameters ◽  
Complete Matrix

The organo-amino compound of title 2-(4-methyl-2-phenyl-4,5-dihydro-oxazol-4-ylmethyl)-isoindole-1,3-dione was synthesized by the mixture of (4-methyl-2-phenyl-4,5-dihydrooxazol-4-yl)methyl-4-methylbenzenesulfonate and isoindoline-1,3-dione in N,N-dimethylformamide with a yield of around 65%. The structural study of the compound, C19H16N2O3, is realized using single crystal X-Ray diffraction which shows that this compound crystallizes in the monoclinic system (P21/c, Z = 4) with the unit cell parameters: a = 14.3728 (13) Ã…, b = 9.6829 (10) Ã…, c = 11.8964 (12) Ã… and β = 107.384 (3). The refinement of the structure by the least-squares method with complete matrix leads to the following reliability factors R/Rw are 0.044/0.130.In the crystal, the molecules are linked together by hydrogen bonds and π…π interactions.The Infrared spectroscopic studies show the bands confirming the presence of the groups C=O, C-O, C-N, -CH3, -CH2 and =CH. 

Thermal Evolution of Magnetic Properties and Crystal Structure in Compositionally Modulated Al/Ni Thin Films

1991 ◽  
Vol 232 ◽  
Author(s):  
A. Waknis ◽  
E. Haftek ◽  
M. Tan ◽  
J. A. Barnard ◽  
E. Tsang
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Magnetic Properties ◽  
Thermal Evolution ◽  
Dead Layer ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Individual ◽  
Deposited Films

ABSTRACTPeriodic multilayer thin films of the form (xAl/yNi)n were grown by alternate deposition of pure Al and Ni using dc-magnetron sputtering. The thicknesses of the individual Al and Ni layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm while y was systematically varied from 2.4 to 154 nm. The films were tested in as-deposited and annealed states for magnetic properties using a vibrating sample magnetometer and for crystal structure by x-ray diffraction. In both the as-deposited and annealed samples the magnetization per unit volume of Ni declined as the Ni layer thickness decreased. This result can be interpreted in terms of a magnetically ‘dead’ layer at the Al/Ni interfaces. The width of the dead layer increased from 2.9 nm to 5.8 nm on annealing. Magnetic properties were correlated with crystal structure experiments by x-ray diffraction. As-deposited films yielded a Ni(111) texture. The Ni (111) peak decreased in intensity and broadened as the Ni thickness declined. Annealing produced evidence for the growth of the intermetallic NiAl3.

Synthesis and characterization of a hexaphyrin(1.0.1.0.0.0) bearing both meso- and β-substituents

2007 ◽  
Vol 11 (04) ◽  
pp. 287-293 ◽  
Author(s):  
Jonathan L. Sessler ◽  
Patricia J. Melfi ◽  
Vincent M. Lynch
Keyword(s):  
Crystal Structure ◽  
Ring Current ◽  
Spectroscopic Studies ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
H Nmr ◽  
Planar Conformation ◽  
Hydrogen Bound

The synthesis of an isoamethyrin-type expanded porphyrin bearing both meso- and β-substituents is presented. The diprotonated form of this macrocycle was characterized by conventional spectroscopic means and via a single crystal X-ray diffraction analysis. This species is observed to adopt a planar conformation in the solid state. Nonetheless, the inner ring current, as inferred from 1 H NMR spectroscopic studies, is found to be severely diminished as compared to isoamethyrin, by the presence of the two meso-phenyl moieties. A second crystal structure, in which a molecule of water is hydrogen-bound to a pyrrole NH , was also solved.

scholarly journals Bis(3-phenylpropylammonium) dichromate (VI): Synthesis, crystal structure and spectroscopy studies

2016 ◽  
Vol 11 (1) ◽  
pp. 3394-3403 ◽  
Author(s):  
Sonia Trabelsi ◽  
Thierry Roisnel ◽  
Houda Marouani
Keyword(s):  
Crystal Structure ◽  
Hydrogen Bonds ◽  
Spectroscopic Studies ◽  
Supramolecular Network ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Monoclinic System ◽  
X Ray ◽  
Dichromate Anions ◽  
Spectroscopy Studies

The structure of bis(3-Phenylpropylammonium) dichromate(VI) was determined from X-ray diffraction data. The compound crystallizes in the monoclinic system (space group P21/c) with the lattice parameters: a = 7.9379(2) Å, b = 36.2439(16) Å, c = 7.5753(3) Å; B = 96.069(2); V= 2167.20(14) Å3 and Z = 4. The structure was solved from 4959 independent reflections with R = 0.043 and Rw = 0.105. The structure consists of discrete dichromate anions (Cr2O72-) with eclipsed conformation stacked in layers parallel to (a, c) plane at y = 0 and ½. These anions are linked via the 3-phenylpropylammonium cations by N—H…O and C—H…O hydrogen bonds, forming a two-dimensional supramolecular network. Crystal structure and spectroscopic studies are reported for the bis(3-phenylpropylammonium) dichromate(VI).

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