Origin of the bias stress instability in single-crystal organic field-effect transistors

2010 ◽  
Vol 82 (8) ◽  
Author(s):  
B. Lee ◽  
A. Wan ◽  
D. Mastrogiovanni ◽  
J. E. Anthony ◽  
E. Garfunkel ◽  
...  
2017 ◽  
Vol 9 (39) ◽  
pp. 34153-34161 ◽  
Author(s):  
Hyun Ho Choi ◽  
Hikmet Najafov ◽  
Nikolai Kharlamov ◽  
Denis V. Kuznetsov ◽  
Sergei I. Didenko ◽  
...  

2013 ◽  
Vol 102 (11) ◽  
pp. 113306 ◽  
Author(s):  
H. Sinno ◽  
S. Fabiano ◽  
X. Crispin ◽  
M. Berggren ◽  
I. Engquist

2019 ◽  
Vol 11 (37) ◽  
pp. 34188-34195 ◽  
Author(s):  
Hongming Chen ◽  
Xing Xing ◽  
Miao Zhu ◽  
Jupeng Cao ◽  
Muhammad Umair Ali ◽  
...  

2011 ◽  
Vol 24 (3) ◽  
pp. 345-348 ◽  
Author(s):  
Yoshihito Kunugi ◽  
Tatsuya Arai ◽  
Norihito Kobayashi ◽  
Hiroyuki Otsuki ◽  
Toru Nishinaga ◽  
...  

2010 ◽  
Vol 23 (3) ◽  
pp. 323-326 ◽  
Author(s):  
Yoshihiko Kunugi ◽  
Tatuya Arai ◽  
Masanori Tsutsui ◽  
Hidetoshi Maeda ◽  
Kazuo Okamoto

Sign in / Sign up

Export Citation Format

Share Document