Improving Bias-Stress Stability of p-Type Organic Field-Effect Transistors by Constructing an Electron Injection Barrier at the Drain Electrode/Semiconductor Interfaces
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2012 ◽
Vol 116
(23)
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pp. 12779-12785
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2014 ◽
Vol 47
(35)
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pp. 355101
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2017 ◽
Vol 9
(39)
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pp. 34153-34161
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2011 ◽
Vol 13
(32)
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pp. 14387
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Comparison of p-type and n-type organic field-effect transistors using nickel coordination compounds
2006 ◽
Vol 421
(4-6)
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pp. 395-398
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