scholarly journals Comment on “Wave-scattering formalism for thermal conductance in thin wires with surface disorder”

2010 ◽  
Vol 81 (11) ◽  
Author(s):  
Marcos G. Menezes ◽  
Jordan Del Nero ◽  
Rodrigo B. Capaz ◽  
Luis G. C. Rego
Keyword(s):  
Wave Scattering ◽  
Thermal Conductance ◽  
Thin Wires ◽  
Surface Disorder

Silicon Nanowire Conductance in the Ballistic Regime: Models and Simulations

2012 ◽  
Vol 134 (5) ◽  
Author(s):  
David Lacroix ◽  
Karl Joulain ◽  
Jerome Muller ◽  
Gilles Parent
Keyword(s):  
Elastic Wave ◽  
Heat Transport ◽  
Silicon Nanowires ◽  
Silicon Nanowire ◽  
Normal Modes ◽  
Thermal Conductance ◽  
Wave Theory ◽  
Ballistic Regime ◽  
Thin Wires ◽  
Transmission And Reflection

This study deals with phonon heat transport in silicon nanowires. A review of various methods that can be used to assess thermal conductance of such nanodevices is presented. Here, a specific attention is paid to the case of the Landauer Formalism, which can describe extremely thin wires conductance. In order to use this technique, the calculation of propagating modes in a silicon nanowire is necessary. Among the several existing models allowing such calculation, the elastic wave theory has been used to obtain the normal mode number. Besides, in this study, the transmission and reflection of phonon at the interface between two nanostructures are discussed. Using the diffuse mismatch model (DMM), the global transmissivity of the system made of a nanowire suspended between two thermal reservoirs is addressed. Then, the calculations of normal modes’ numbers and thermal conductances of several silicon nanowires, with various diameters set between bulk thermal reservoirs, are presented and compared to other models and available experiments.

Silicon Nanowire Conductance in the Ballistic Regime: Models and Simulation

2009 ◽  
Author(s):  
David Lacroix ◽  
Karl Joulain ◽  
Jerome Muller ◽  
Gilles Parent
Keyword(s):  
Elastic Wave ◽  
Silicon Nanowires ◽  
Silicon Nanowire ◽  
Normal Modes ◽  
Thermal Conductance ◽  
Wave Theory ◽  
Ballistic Regime ◽  
Thin Wires ◽  
20 Nm ◽  
Transmission And Reflection

This paper deals with phonon heat transport in silicon nanowires. A review of various techniques that can be used to assess thermal conductance of such nanodevices is presented and a peculiar attention is paid to the case of the Landauer Formalism that can describe extremely thin wires. Several models for normal modes of silicon nanowire determination are considered, among them elastic wave theory has been used to determine the normal mode number. Besides, transmission and reflection of phonon at the interface between two nanostructures is discussed. Calculations and comparisons of thermal conductance of a 20 nm silicon nanowire between bulk thermal reservoirs are thus discussed.

Improvements on the gaseous detector device

1986 ◽  
Vol 44 ◽  
pp. 630-631 ◽  
Author(s):  
G.D. Danilatos
Keyword(s):  
Gaseous Medium ◽  
The Other ◽  
Beam Specimen ◽  
Thin Wires ◽  
Interference Noise ◽  
Backscattered Electron ◽  
Detection Of Signals ◽  
Environmental Sem

The possibility of placing the specimen in a gaseous medium in the environmental SEM (ESEM) has created novel ways for detection of signals from the beam-specimen interactions. It was originally reported by Oanilatos that the ionization produced by certain signals inside the conditioning medium can be used to produce images. The aim of this report is to demonstrate some of the improvements on the system that have occurred thereafter.Two straight thin wires are aligned horizontally along a direction normal to the direction of the two scintillator backscattered electron (BSE) detectors reported elsewhere. The free end tips of the wires are about 5 mm apart halfway between the specimen and the pressure limiting aperture (specimen distance = 1.5 mm). The other end of each wire makes contact with the input of a separate preamplifier, two of which are built inside a shielding aluminum stub. With such a design, interference noise from the input cables is avoided.

Ultrasonic Wave Scattering by a Line Crack in a Solder Joint

1999 ◽  
Vol 11 (1) ◽  
pp. 117-135
Author(s):  
P. Dineva ◽  
D. Gross ◽  
T. Rangelov
Keyword(s):  
Solder Joint ◽  
Ultrasonic Wave ◽  
Wave Scattering ◽  
Line Crack
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