Grazing-incidence diffraction anomalous fine structure: Application to the structural investigation of group-III nitride quantum dots

2007 ◽  
Vol 75 (23) ◽  
Author(s):  
J. Coraux ◽  
V. Favre-Nicolin ◽  
M. G. Proietti ◽  
B. Daudin ◽  
H. Renevier
Keyword(s):  
Quantum Dots ◽  
Fine Structure ◽  
Structural Investigation ◽  
Grazing Incidence ◽  
Group Iii ◽  
Grazing Incidence Diffraction ◽  
Group Iii Nitride

Control of the 3-Fold Symmetric Shape of Group III-Nitride Quantum Dots: Suppression of Fine-Structure Splitting

Nano Letters ◽  
2020 ◽  
Vol 20 (12) ◽  
pp. 8461-8468
Author(s):  
Hwan-Seop Yeo ◽  
Kwanjae Lee ◽  
Jong-Hoi Cho ◽  
Seoung-Hwan Park ◽  
Yong-Hoon Cho
Keyword(s):  
Quantum Dots ◽  
Fine Structure ◽  
Group Iii ◽  
Fine Structure Splitting ◽  
Structure Splitting ◽  
Group Iii Nitride ◽  
Symmetric Shape

In situ andex situ grazing incidence diffraction anomalous fine structure study of GaN/AlN quantum dots

2006 ◽  
Vol 243 (7) ◽  
pp. 1519-1523 ◽  
Author(s):  
J. Coraux ◽  
H. Renevier ◽  
M. G. Proietti ◽  
V. Favre-Nicolin ◽  
B. Daudin ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Fine Structure ◽  
Grazing Incidence ◽  
Structure Study ◽  
Grazing Incidence Diffraction

Vertical alignment of multilayered quantum dots studied by x-ray grazing-incidence diffraction

1999 ◽  
Vol 60 (4) ◽  
pp. 2516-2521 ◽  
Author(s):  
I. Kegel ◽  
T. H. Metzger ◽  
J. Peisl ◽  
J. Stangl ◽  
G. Bauer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
Vertical Alignment ◽  
X Ray ◽  
Grazing Incidence Diffraction

6.4.5 Group III–nitride based quantum dots

2013 ◽  
pp. 126-127
Author(s):  
C. Höfling ◽  
C. Schneider ◽  
A. Forchel
Keyword(s):  
Quantum Dots ◽  
Group Iii ◽  
Group Iii Nitride

Strain and Shape in Self-Assembled Quantum Dots Studied by X-Ray Grazing Incidence Diffraction

1998 ◽  
Vol 524 ◽  
Author(s):  
I. Kegel ◽  
T. H. Metzger ◽  
J. Peisl ◽  
P. Fratzl ◽  
A. Lorke ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
Lattice Parameter ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Surface Reflection ◽  
Grazing Incidence Diffraction ◽  
Shape Effects ◽  
Outer Perimeter ◽  
Highly Strained

ABSTRACTWe have developed a method to determine the relationship between strain and lateral size of coherent self-organized quantum dots. In our approach, X-ray grazing incidence diffraction is used to collect information on strain and shape effects in the vicinity of a prominent surface reflection. We demonstrate that for highly strained nano-scale islands it is possible to separate strain-induced and form factor-induced scattering without comparing different reflections. Experimental data from InAs on GaAs(100) quantum dots is discussed with respect to this model. Reciprocal space mapping around the (220) surface reflection shows a linear relationship between relaxation from the substrate lattice parameter and the outer perimeter of the dot. In addition, the functional form of the gradient of relaxation is found to be nonmonotonous and rapidly increasing towards the tip of the dot.

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