Vertical alignment of multilayered quantum dots studied by x-ray grazing-incidence diffraction

1999 ◽  
Vol 60 (4) ◽  
pp. 2516-2521 ◽  
Author(s):  
I. Kegel ◽  
T. H. Metzger ◽  
J. Peisl ◽  
J. Stangl ◽  
G. Bauer ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
Vertical Alignment ◽  
X Ray ◽  
Grazing Incidence Diffraction

Strain and Shape in Self-Assembled Quantum Dots Studied by X-Ray Grazing Incidence Diffraction

1998 ◽  
Vol 524 ◽  
Author(s):  
I. Kegel ◽  
T. H. Metzger ◽  
J. Peisl ◽  
P. Fratzl ◽  
A. Lorke ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
Lattice Parameter ◽  
Reciprocal Space Mapping ◽  
X Ray ◽  
Surface Reflection ◽  
Grazing Incidence Diffraction ◽  
Shape Effects ◽  
Outer Perimeter ◽  
Highly Strained

ABSTRACTWe have developed a method to determine the relationship between strain and lateral size of coherent self-organized quantum dots. In our approach, X-ray grazing incidence diffraction is used to collect information on strain and shape effects in the vicinity of a prominent surface reflection. We demonstrate that for highly strained nano-scale islands it is possible to separate strain-induced and form factor-induced scattering without comparing different reflections. Experimental data from InAs on GaAs(100) quantum dots is discussed with respect to this model. Reciprocal space mapping around the (220) surface reflection shows a linear relationship between relaxation from the substrate lattice parameter and the outer perimeter of the dot. In addition, the functional form of the gradient of relaxation is found to be nonmonotonous and rapidly increasing towards the tip of the dot.

Erratum: X‐ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers [J. Chem. Phys. 95, 2854 (1991)]

1993 ◽  
Vol 98 (2) ◽  
pp. 1754-1754
Author(s):  
I. M. Tidswell ◽  
T. A. Rabedeau ◽  
P. S. Pershan ◽  
S. D. Kosowsky ◽  
J. P. Folkers ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Chem Phys ◽  
Silicon Wafers ◽  
X Ray ◽  
Grazing Incidence Diffraction

Grazing incidence diffraction of cadmium arachidate multilayers at the solid-liquid interface

2005 ◽  
Vol 220 (12) ◽  
Author(s):  
Chad E. Miller ◽  
Jaroslaw Majewski ◽  
Thomas Gog ◽  
Tonya L. Kuhl
Keyword(s):  
Arachidic Acid ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Organic Layers ◽  
Grazing Incidence Diffraction ◽  
Synchrotron Beam ◽  
Solid Liquid Interface ◽  
Solid Liquid ◽  
Monochromatic Synchrotron

AbstractUsing complementary X-ray reflectivity (XR) and grazing incidence X-ray diffraction (GIXD), we report structural studies of supported thin-organic layers in contact with water and air. Using a monochromatic synchrotron beam to penetrate 10 mm of liquid, we have characterized buried films composed of 12.5 repeating bilayers of arachidic acid (C

Waveguide-enhanced scattering from thin biomolecular films

2002 ◽  
Vol 35 (2) ◽  
pp. 163-167 ◽  
Author(s):  
F. Pfeiffer ◽  
U. Mennicke ◽  
T. Salditt
Keyword(s):  
Lipid Bilayers ◽  
Signal To Noise Ratio ◽  
Acyl Chain ◽  
Grazing Incidence ◽  
Waveguide Structure ◽  
X Ray Diffraction ◽  
Signal To Noise ◽  
X Ray ◽  
Grazing Incidence Diffraction ◽  
Chain Ordering

An X-ray diffraction experiment on multilamellar membranes incorporated into an X-ray waveguide structure is reported. In the device, the lipid bilayers are confined to one side by the silicon substrate and to the other side by an evaporated thin metal cap layer. Shining a highly brilliant X-ray beam onto the system, resonantly enhanced, precisely defined and clearly distinguishable standing-wavefield distributions (modes) are excited. The in-plane structure of the acyl chain ordering is then studied by grazing incidence diffraction under simultaneously excited modes. A significant gain in signal-to-noise ratio as well as enhanced spatial resolution can be obtained with such a setup.

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