Characterization of antiphase boundary network inFe3O4(111)epitaxial thin films: Effect on anomalous magnetic behavior

2006 ◽  
Vol 74 (15) ◽  
Author(s):  
A. M. Bataille ◽  
L. Ponson ◽  
S. Gota ◽  
L. Barbier ◽  
D. Bonamy ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Behavior ◽  
Antiphase Boundary ◽  
Epitaxial Thin Films

Preparation and Structural Characterization of hcp and fcc Ni Epitaxial Thin Films on Ru Underlayers with Different Orientations

2011 ◽  
Vol 50 (6) ◽  
pp. 063001 ◽  
Author(s):  
Jumpei Higuchi ◽  
Mitsuru Ohtake ◽  
Yoichi Sato ◽  
Tsutomu Nishiyama ◽  
Masaaki Futamoto
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Epitaxial Thin Films

Characterization of epitaxial thin films of Bi2VO5.5 on La-doped SrTiO3 substrates prepared by coating-pyrolysis process

2002 ◽  
Vol 422 (1-2) ◽  
pp. 73-79 ◽  
Author(s):  
Kenichi Tsukada ◽  
Tsutomu Nagahama ◽  
Mitsugu Sohma ◽  
Iwao Yamaguchi ◽  
Takaaki Manabe ◽  
...  
Keyword(s):  
Thin Films ◽  
Epitaxial Thin Films ◽  
Pyrolysis Process ◽  
La Doped

Photoluminescence characterization of Zn1−xMgxO epitaxial thin films grown on ZnO by radical source molecular beam epitaxy

2007 ◽  
Vol 90 (12) ◽  
pp. 124104 ◽  
Author(s):  
H. Shibata ◽  
H. Tampo ◽  
K. Matsubara ◽  
A. Yamada ◽  
K. Sakurai ◽  
...  
Keyword(s):  
Thin Films ◽  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Epitaxial Thin Films

Characterization of Ferroelectric Property of c-axis and non-c-axis Oriented Epitaxially Grown Bismuth Layer-Structured Ferroelectric Thin Films with Different m-numbers Prepared by MOCVD

2000 ◽  
Vol 655 ◽  
Author(s):  
Takayuki Watanabe ◽  
Tomohiro Sakai ◽  
Atsushi Saiki ◽  
Keisuke Saito ◽  
Toyohiko Chikyo ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Leakage Current ◽  
Ferroelectric Property ◽  
Metalorganic Chemical Vapor Deposition ◽  
Chemical Vapor ◽  
Epitaxial Thin Films ◽  
Oriented Film ◽  
Deposited Films

AbstractEpitaxial thin films of bismuth layer-structured ferroelectrics (BLSF) with different m-numbers, i.e., Bi2VO5.5 (BVO) (m=1), SrBi2Ta2O9 (SBT) (m=2), and Bi4Ti3O12 (BIT) (m=3), were grown by metalorganic chemical vapor deposition (MOCVD). (00l)-oriented films were deposited on (100)SrTiO3. (114)-oriented BVO, (116)-oriented SBT, and (118)-oriented BIT films were deposited on (110)SrTiO3. Moreover, (102)-oriented BVO, (103)-oriented SBT, and (104)-oriented BIT films were deposited on (111)SrTiO3. On (100), (110), and (111)SrTiO3 substrates, c-axis of the deposited films was tilted about 0°, 45°, and 56°, respectively, against perpendicular to the surface of the substrates irrespective of m-number. This suggests the growth of crystallographic equivalent orientation. The distinctive surface morphology originated to the feature of the film orientation was observed. The dielectric constant and the leakage current of c-axis-oriented film was smaller than that of non-c-axis-oriented one, indicating smaller dielectric constant and leakage current along c-axis than a- or b-axes. A larger ferroelectric anisotropy was ascertained for SBT and BIT films. Furthermore, the evaluated spontaneous polarization along a- and c- axes of BIT from the data of the epitaxially grown BIT films well agreed with the reported one for the single crystal. This suggests the ferroelectric property was not strongly affected by the strain in the films.

Growth and characterization of epitaxial thin films of conductive ferromagnetic oxide SrRuO3

1998 ◽  
Vol 83 (11) ◽  
pp. 6539-6541 ◽  
Author(s):  
C. B. Eom ◽  
R. A. Rao ◽  
Q. Gan ◽  
D. B. Kacedon
Keyword(s):  
Thin Films ◽  
Epitaxial Thin Films

Structural and magnetic characterization of mixed valence Co(II, III)xZn1−xO epitaxial thin films

2014 ◽  
Vol 354 ◽  
pp. 39-43 ◽  
Author(s):  
D.S. Negi ◽  
B. Loukya ◽  
K. Dileep ◽  
R. Sahu ◽  
S. Shetty ◽  
...  
Keyword(s):  
Thin Films ◽  
Mixed Valence ◽  
Epitaxial Thin Films ◽  
Magnetic Characterization

scholarly journals Preparation and Structure Characterization of Sm-Ni Alloy Epitaxial Thin Films

2015 ◽  
Vol 39 (5) ◽  
pp. 186-190
Author(s):  
Yusuke Hotta ◽  
Takato Yanagawa ◽  
Makoto Yamada ◽  
Mitsuru Ohtake ◽  
Masaaki Futamoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Structure Characterization ◽  
Epitaxial Thin Films ◽  
Ni Alloy

Growth and characterization of non-c-axis-oriented SrBi2Ta2O9 epitaxial thin films on Si(100) substrates with SrRuO3 bottom electrodes

2001 ◽  
Vol 39 (1-4) ◽  
pp. 73-80 ◽  
Author(s):  
Ho Nyung Lee ◽  
Dmitri Zakharov ◽  
Stephan Senz ◽  
Alain Pignolet ◽  
Dietrich Hesse
Keyword(s):  
Thin Films ◽  
Epitaxial Thin Films
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