scholarly journals Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy

2005 ◽  
Vol 72 (23) ◽  
Author(s):  
Anne-Sophie Lucier ◽  
Henrik Mortensen ◽  
Yan Sun ◽  
Peter Grütter
Keyword(s):  
Atomic Structure ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Field Ion Microscopy ◽  
Probe Microscopy ◽  
Ion Microscopy

2013 Microscopy Today Innovation Awards

2013 ◽  
Vol 21 (5) ◽  
pp. 40-45
Keyword(s):  
Electron Microscopy ◽  
Light Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Analysis Methods ◽  
Microscopy Analysis ◽  
Ion Microscopy ◽  
Microscopy Techniques

Microscopy Today congratulates the fourth annual group of Innovation Award winners. The ten innovations described below move several microscopy techniques forward: light microscopy, scanning probe microscopy, electron microscopy, ion microscopy, and hybrid microscopy-analysis methods. These innovations will make imaging and analysis more powerful, more flexible, more productive, and easier to accomplish.

Atomic Structure and Electrical Properties of In(Te) Nanocontacts on CdZnTe(110) by Scanning Probe Microscopy

2010 ◽  
Vol 20 (2) ◽  
pp. 215-223 ◽  
Author(s):  
Gili Cohen-Taguri ◽  
Ori Sinkevich ◽  
Mario Levinshtein ◽  
Arie Ruzin ◽  
Ilan Goldfarb
Keyword(s):  
Electrical Properties ◽  
Atomic Structure ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy
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