Complex dielectric function of biaxial tensile strained silicon by spectroscopic ellipsometry

2005 ◽  
Vol 71 (24) ◽  
Author(s):  
C. J. Vineis
2003 ◽  
Vol 195 (1) ◽  
pp. 277-281 ◽  
Author(s):  
E. R. Shaaban ◽  
T. Lohner ◽  
P. Petrik ◽  
N. Q. Khánh ◽  
M. Fried ◽  
...  

2008 ◽  
Vol 5 (5) ◽  
pp. 1374-1377 ◽  
Author(s):  
T. Lohner ◽  
Z. Zolnai ◽  
P. Petrik ◽  
G. Battistig ◽  
J. Garcia López ◽  
...  

Micron ◽  
2021 ◽  
pp. 103124
Author(s):  
G. Herrera-Perez ◽  
C. Ornelas-Gutierrez ◽  
A. Reyes-Montero ◽  
F. Paraguay-Delgado ◽  
A. Reyes-Rojas ◽  
...  

1983 ◽  
Vol 6 ◽  
pp. 309-316 ◽  
Author(s):  
H. Arwin ◽  
D.E. Aspnes ◽  
R. Bjorklund ◽  
I. Lundström

2009 ◽  
Vol 20 (30) ◽  
pp. 305702 ◽  
Author(s):  
F Ahmed ◽  
A En Naciri ◽  
J J Grob ◽  
M Stchakovsky ◽  
L Johann

2003 ◽  
Author(s):  
Masahiro Horie ◽  
Kamil Postava ◽  
Tomuo Yamaguchi ◽  
Kumiko Akashika ◽  
Hideki Hayashi ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document