Complex dielectric function of biaxial tensile strained silicon by spectroscopic ellipsometry
2008 ◽
Vol 5
(5)
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pp. 1374-1377
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Keyword(s):
2020 ◽
Vol 38
(1)
◽
pp. 014001
1988 ◽
Vol 23
(5)
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pp. 1841-1850
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Keyword(s):