Stochastic mechanism of energy dissipation in noncontact atomic force microscopy studied using molecular dynamics with Langevin boundary conditions

2004 ◽  
Vol 70 (11) ◽  
Author(s):  
T. Trevethan ◽  
L. Kantorovich
Keyword(s):  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Boundary Conditions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Stochastic Mechanism

In Operando Detection of the Physical Properties Change of the Interfacial Electrolyte during Li-Metal Electrode Reaction by Atomic Force Microscopy

2020 ◽  
Author(s):  
Mitsunori Kitta
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Physical Properties ◽  
Electrode Surface ◽  
Electrode Reaction ◽  
Metal Electrode ◽  
Ion Concentration ◽  
Force Microscopy ◽  
Atomic Force ◽  
Discharge Reaction

This manuscript propose the operando detection technique of the physical properties change of electrolyte during Li-metal battery operation.The physical properties of electrolyte solution such as viscosity (η) and mass densities (ρ) highly affect the feature of electrochemical Li-metal deposition on the Li-metal electrode surface. Therefore, the operando technique for detection these properties change near the electrode surface is highly needed to investigate the true reaction of Li-metal electrode. Here, this study proved that one of the atomic force microscopy based analysis, energy dissipation analysis of cantilever during force curve motion, was really promising for the direct investigation of that. The solution drag of electrolyte, which is controlled by the physical properties, is directly concern the energy dissipation of cantilever motion. In the experiment, increasing the energy dissipation was really observed during the Li-metal dissolution (discharge) reaction, understanding as the increment of η and ρ of electrolyte via increasing of Li-ion concentration. Further, the dissipation energy change was well synchronized to the charge-discharge reaction of Li-metal electrode.This study is the first report for direct observation of the physical properties change of electrolyte on Li-metal electrode reaction, and proposed technique should be widely interesting to the basic interfacial electrochemistry, fundamental researches of solid-liquid interface, as well as the battery researches.

scholarly journals Dynamic friction energy dissipation and enhanced contrast in high frequency bimodal atomic force microscopy

Friction ◽  
2021 ◽  
Author(s):  
Xinfeng Tan ◽  
Dan Guo ◽  
Jianbin Luo
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Contact Friction ◽  
Measuring Instruments ◽  
Dynamic Friction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Friction Energy ◽  
New Applications

AbstractDynamic friction occurs not only between two contact objects sliding against each other, but also between two relative sliding surfaces several nanometres apart. Many emerging micro- and nano-mechanical systems that promise new applications in sensors or information technology may suffer or benefit from noncontact friction. Herein we demonstrate the distance-dependent friction energy dissipation between the tip and the heterogeneous polymers by the bimodal atomic force microscopy (AFM) method driving the second order flexural and the first order torsional vibration simultaneously. The pull-in problem caused by the attractive force is avoided, and the friction dissipation can be imaged near the surface. The friction dissipation coefficient concept is proposed and three different contact states are determined from phase and energy dissipation curves. Image contrast is enhanced in the intermediate setpoint region. The work offers an effective method for directly detecting the friction dissipation and high resolution images, which overcomes the disadvantages of existing methods such as contact mode AFM or other contact friction and wear measuring instruments.

scholarly journals Modeling of DNA binding to the condensin hinge domain using molecular dynamics simulations guided by atomic force microscopy

2021 ◽  
Author(s):  
Hiroki Koide ◽  
Noriyuki Kodera ◽  
Shveta Bisht ◽  
Shoji Takada ◽  
Tsuyoshi Terakawa
Keyword(s):  
Molecular Dynamics ◽  
Atomic Force Microscopy ◽  
Molecular Dynamics Simulations ◽  
Coarse Grained ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dna Loop ◽  
Dynamics Simulations ◽  
Dsdna Binding ◽  
Hinge Domain

The condensin protein complex compacts chromatin during mitosis using its DNA-loop extrusion activity. Previous studies proposed scrunching and loop-capture models as molecular mechanisms for the loop extrusion process, both of which assume the binding of double-strand (ds) DNA to the so-called hinge domain formed at the interface of the condensin subunits Smc2 and Smc4. However, how the hinge domain contacts dsDNA has remained unknown, potentially due to its conformational plasticity. Here, we conducted atomic force microscopy imaging of the budding yeast condensin holo-complex and used this data as basis for coarse-grained molecular dynamics simulations to model the hinge structure in a transient open conformation. We then simulated the dsDNA binding to open and closed hinge conformations, predicting that dsDNA binds to the outside surface when closed and to the outside and inside surfaces when open. Our simulations also suggested that the hinge can close around dsDNA bound to the inside surface. The conformational change of the hinge domain might be essential for the dsDNA binding regulation and play important roles in condensin-mediated DNA-loop extrusion.

Measurement of Intramolecular Energy Dissipation and Stiffness of a Single Peptide Molecule by Magnetically Modulated Atomic Force Microscopy

2004 ◽  
Vol 43 (No. 12A) ◽  
pp. L1510-L1513 ◽  
Author(s):  
Masami Kageshima ◽  
Seiji Takeda ◽  
Arkadiusz Ptak ◽  
Chikashi Nakamura ◽  
Suzanne P. Jarvis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Force Microscopy ◽  
Peptide Molecule ◽  
Atomic Force ◽  
Single Peptide

How to measure energy dissipation in dynamic mode atomic force microscopy

1999 ◽  
Vol 140 (3-4) ◽  
pp. 376-382 ◽  
Author(s):  
B. Anczykowski ◽  
B. Gotsmann ◽  
H. Fuchs ◽  
J.P. Cleveland ◽  
V.B. Elings
Keyword(s):  
Atomic Force Microscopy ◽  
Energy Dissipation ◽  
Dynamic Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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