scholarly journals Structure of self-organized Fe clusters grown on Au(111) analyzed by grazing incidence x-ray diffraction

2004 ◽  
Vol 69 (15) ◽  
Author(s):  
H. Bulou ◽  
F. Scheurer ◽  
P. Ohresser ◽  
A. Barbier ◽  
S. Stanescu ◽  
...  
1998 ◽  
Vol 58 (12) ◽  
pp. 7934-7943 ◽  
Author(s):  
V. Holý ◽  
A. A. Darhuber ◽  
J. Stangl ◽  
S. Zerlauth ◽  
F. Schäffler ◽  
...  

2015 ◽  
Vol 48 (2) ◽  
pp. 444-454 ◽  
Author(s):  
Neelima Paul ◽  
Jassen Brumbarov ◽  
Amitesh Paul ◽  
Ying Chen ◽  
Jean-Francois Moulin ◽  
...  

Self-organized anodic titania (TiO2) nanotube arrays are an interesting model anode material for use in Li-ion batteries owing to their excellent rate capability, their cycling stability and their enhanced safety compared to graphite. A composite material where carbothermally treated conductive TiO2nanotubes are used as support for a thin silicon film has been shown to have the additional advantage of high lithium storage capacity. This article presents a detailed comparison of the structure, surface and bulk morphology of self-organized conductive TiO2nanotube arrays, with and without silicon coating, using a combination of X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering (GISAXS) and time-of-flight grazing-incidence small-angle neutron scattering (TOF-GISANS) techniques. X-ray diffraction shows that the nanotubes crystallize in the anatase structure with a preferred (004) orientation. GISAXS and TOF-GISANS are used to study the morphology of the nanotube arrays, delivering values for the inner nanotube radius and intertubular distances with high statistical relevance because of the large probed volume. The analyses reveal the distinct signatures of a prominent lateral correlation of the TiO2nanotubes of ∼94 nm and a nanotube radius of ∼46 nm. The porosity averaged over the entire film using TOF-GISANS is 46%. The inner nanotube radius is reduced to half (∼23 nm) through the silicon coating, but the prominent lateral structure is preserved. Such in-depth morphological investigations over large sample volumes are useful towards development of more efficient battery electrode morphologies.


2007 ◽  
Vol 40 (5) ◽  
pp. 874-882 ◽  
Author(s):  
Geoffroy Prévot ◽  
Alessandro Coati ◽  
Bernard Croset ◽  
Yves Garreau

It is demonstrated that grazing-incidence X-ray diffraction is a direct tool for measuring the elastic displacement modes near the surface of a crystal. Due to the fact that X-ray diffraction is a Fourier transform of the electronic density, and thus, of the atomic positions, elastic displacement modes appear as additional spots in the reciprocal space. Their characteristics can be directly derived from the elastic constants of the material. Measuring the amplitude of the diffracted wave for these peaks allows direct determination of the force distribution at the surface, which is at the origin of the elastic displacements. Various examples of such determinations are given for self-organized surfaces and for vicinal surfaces.


2000 ◽  
Vol 618 ◽  
Author(s):  
V. Holý ◽  
J. Stangl ◽  
G. Springholz ◽  
M. Pinczolits ◽  
G. Bauer

ABSTRACTThe shape and the positions of self-organized PbSe quantum dots embedded in PbEuTe are studied by means of grazing-incidence small angle x-ray scattering and x-ray diffraction. Using a detailed numerical analysis of the measured x-ray data, we have determined a truncated pyramidal shape of the free-standing dots. The type of the lateral dot ordering depends substantially on the period of the PbSe/PbEuTe superlattice. In the case of smaller periods, the lateral ordering of the dots obeys a short-range order model and we have determined the statistical properties of the dot arrangement. For intermediate spacer thicknesses the dots form a hexagonal lattice. For larger periods, the dots are completely uncorrelated and their distribution can be described as a two-dimensional ideal gas. From coplanar x-ray diffraction we have determined additionally the vertical correlation of the dot positions changes from a mere vertical correlation for small superlattice periods, to a distorted trigonal lattice for the intermediate periods. For the largest period, no vertical correlation of dot positions is observed.


2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.


Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.


2007 ◽  
Vol 75 (3) ◽  
Author(s):  
Aparna Pareek ◽  
Xavier Torrelles ◽  
Jordi Rius ◽  
Uta Magdans ◽  
Hermann Gies

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