Frequency-dependent electron spin resonance study ofPb-type interface defects in thermalSi/SiO2
2004 ◽
Vol 72
(1-4)
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pp. 76-80
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1971 ◽
Vol 93
(25)
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pp. 6888-6890
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1987 ◽
Vol 36
(3)
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pp. 267-278
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