scholarly journals Conductance of a quantum point contact in the presence of a scanning probe microscope tip

2002 ◽  
Vol 65 (20) ◽  
Author(s):  
Guang-Ping He ◽  
Shi-Liang Zhu ◽  
Z. D. Wang
Keyword(s):  
Point Contact ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Quantum Point Contact ◽  
Probe Microscope ◽  
Quantum Point

scholarly journals Electron interferometer formed with a scanning probe tip and quantum point contact

2009 ◽  
Vol 80 (4) ◽  
Author(s):  
M. P. Jura ◽  
M. A. Topinka ◽  
M. Grobis ◽  
L. N. Pfeiffer ◽  
K. W. West ◽  
...  
Keyword(s):  
Point Contact ◽  
Scanning Probe ◽  
Quantum Point Contact ◽  
Quantum Point

scholarly journals Scanning probe-induced thermoelectrics in a quantum point contact

2021 ◽  
Vol 119 (4) ◽  
pp. 043101
Author(s):  
Geneviève Fleury ◽  
Cosimo Gorini ◽  
Rafael Sánchez
Keyword(s):  
Point Contact ◽  
Scanning Probe ◽  
Quantum Point Contact ◽  
Quantum Point

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

Geometric phase of an open double-quantum-dot system detected by a quantum point contact

2020 ◽  
Vol 29 (3) ◽  
pp. 030302
Author(s):  
Qian Du ◽  
Kang Lan ◽  
Yan-Hui Zhang ◽  
Lu-Jing Jiang
Keyword(s):  
Quantum Dot ◽  
Geometric Phase ◽  
Point Contact ◽  
Quantum Point Contact ◽  
Double Quantum ◽  
Double Quantum Dot ◽  
Quantum Point
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