High-resolution optical detection of electron spin resonance in epitaxial semiconductor layers by coherent Raman spectroscopy

2002 ◽  
Vol 65 (15) ◽  
Author(s):  
S. J. Bingham ◽  
J. J. Davies ◽  
D. Wolverson
Keyword(s):  
Raman Spectroscopy ◽  
Electron Spin Resonance ◽  
High Resolution ◽  
Electron Spin ◽  
Optical Detection ◽  
Spin Resonance ◽  
Coherent Raman

Control of Photo-Induced Degradation in a-Si:H Prepared from Xe-Diluted Silane

1991 ◽  
Vol 219 ◽  
Author(s):  
Satoshi Mashima ◽  
Kazuhiro Hasezaki ◽  
Atsushi Suzuki ◽  
Peter J. McElheny ◽  
Akihisa Matsuda
Keyword(s):  
Raman Spectroscopy ◽  
Infrared Spectroscopy ◽  
Electron Spin Resonance ◽  
Electron Spin ◽  
Thermal Evolution ◽  
Dilution Method ◽  
Film Properties ◽  
Common Features ◽  
Spin Resonance

ABSTRACTFilms were prepared by the Xe-dilution method in an attempt to mimic the microstructure found in low-photodegradation deuterated films which show a greater number of clustered deuterium and microvoids when compared to conventional hydrogenated films. Common features were found for the light soaking behaviors in the film properties characterized by the electron spin resonance, gas thermal evolution, Raman spectroscopy, and infrared spectroscopy among deuterated, conventional hydrogenated, and Xe-diluted films.

Raman and Electron Spin Resonance Investigations of as Prepared and Thermal Annealed Cluster Beam Deposited Carbon Thin Films

2005 ◽  
Vol 887 ◽  
Author(s):  
Giuseppe Compagnini ◽  
Orazio Puglisi ◽  
Mircea Chipara
Keyword(s):  
Thin Films ◽  
Raman Spectroscopy ◽  
Electron Spin Resonance ◽  
Electron Spin ◽  
Resonance Line ◽  
Carbon Cluster ◽  
Single Line ◽  
Carbon Clusters ◽  
Cluster Beam ◽  
Spin Resonance

ABSTRACTNanostructured amorphous carbon thin films deposited by a Low Energy Carbon Cluster Beam Deposition technique have been characterized by Raman spectroscopy and Electron Spin Resonance (ESR). This study focuses on the correlation between carbon cluster structure and sp2 related defects. The ESR spectrum of as prepared and thermally annealed carbon clusters is a single line located near the free electron g-factor. Resonance lines were accurately fitted by a single line symmetric and narrow Lorentzian line. The resonance line parameters (line position, line amplitude, and line width) were found to be extremely sensitive to the thermal treatment of the as deposited samples. The paramagnetic centres are randomly distributed and correlated with the nanosized nature of the investigated system. The absence of the resonance line asymmetry, typical for the ESR spectra of conducting carbaceneous materials, confirms the small size of carbon nanoclusters and indicates poor electrical contacts between them. The resonance line parameters (position, intensity, and width) are not affected by the orientation of the carbon cluster film relative to the direction of the external magnetic field. The evolution of the ESR signal upon thermal treatments is sensitive to the increase of the sp2 average domain size as revealed by Raman spectroscopy. The Raman spectrum of as obtained and thermally annealed carbon clusters, in the domain 1000 cm−1 to 2000 cm−1 shows two Lorentzian lines located at 1300 cm−1 and 1550 cm−1 representing the D and G bands. The position and amplitude of these lines were found to be affected by thermal annealing.

Diamond-like carbon films: electron spin resonance (ESR) and Raman spectroscopy

2004 ◽  
Vol 13 (9) ◽  
pp. 1592-1602 ◽  
Author(s):  
B Druz ◽  
I Zaritskiy ◽  
Y Yevtukhov ◽  
A Konchits ◽  
M Valakh ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Electron Spin Resonance ◽  
Electron Spin ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Spin Resonance
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