Determination of the crystal system and space group ofBaBiO3by convergent-beam electron diffraction and x-ray diffraction using synchrotron radiation

2001 ◽  
Vol 64 (22) ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka
Keyword(s):  
Synchrotron Radiation ◽  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
X Ray Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
X Ray ◽  
Crystal System ◽  
Convergent Beam

Determination of space group of BaPb0.75Bi0.25O3 by convergent-beam electron diffraction

2002 ◽  
Vol 382 (4) ◽  
pp. 422-430 ◽  
Author(s):  
Takuya Hashimoto ◽  
Kenji Tsuda ◽  
Junichiro Shiono ◽  
Junichiro Mizusaki ◽  
Michiyoshi Tanaka
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Space Group Determination of the Room-Temperature Phase ofα '-NaV2O5Using Convergent-Beam Electron Diffraction

2000 ◽  
Vol 69 (7) ◽  
pp. 1939-1941 ◽  
Author(s):  
Kenji Tsuda ◽  
Shuichi Amamiya ◽  
Michiyoshi Tanaka ◽  
Yukio Noda ◽  
Masahiko Isobe ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Room Temperature ◽  
Convergent Beam Electron Diffraction ◽  
Temperature Phase ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Space Group Determination of Decagonal Quasicrystals of an Al70Ni15Fe15Alloy Using Convergent-Beam Electron Diffraction

1992 ◽  
Vol 31 (Part 2, No. 2A) ◽  
pp. L109-L112 ◽  
Author(s):  
Masakazu Saito ◽  
Michiyoshi Tanaka ◽  
An Pang Tsai ◽  
Akihisa Inoue ◽  
Tsuyoshi Masumoto
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Decagonal Quasicrystals ◽  
Convergent Beam

scholarly journals SPACE GROUP DETERMINATION OF Li2O·3Nb2O5 BY CONVERGENT BEAM ELECTRON DIFFRACTION

1984 ◽  
Vol 33 (11) ◽  
pp. 1586
Author(s):  
YANG CUI-YING ◽  
FENG GUO-GANG ◽  
ZHOU YU-QING ◽  
TANG DI-SHENG
Keyword(s):  
Electron Diffraction ◽  
Convergent Beam Electron Diffraction ◽  
Beam Electron ◽  
Space Group ◽  
Convergent Beam

Thickness dependence of the intensities of the 200 forbidden reflections in the TiBe2 diamond type structure

1988 ◽  
Vol 46 ◽  
pp. 826-827
Author(s):  
Dang-Rong Liu ◽  
D. B. Williams
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Convergent Beam Electron Diffraction ◽  
Type Structure ◽  
Beam Electron ◽  
Space Group ◽  
X Ray ◽  
Electron Diffraction Technique ◽  
Convergent Beam ◽  
Diamond Type

It is interesting to note that for the diamond type structure of Si, Ge and diamond, the forbidden {200} reflections in the exact <100> orientation diffraction pattern cannot be seen. In contrast, we also note a standing controversy over the structure of the MgAl2O4, spinel. Its structure was determined long ago by x-ray powder method as Fd3m (the diamond type). However, its electron diffraction pattern taken in the <100> orientation shows weak {200} reflections, which are taken as evidence that the spinel should have the space group F43m (the blende type), rather than Fd3m. Others speculate that these {200} reflections result from the high order Laue zone (HOLZ) reflections, and the spinel should be Fd3m. Nevertheless, still others think that these analyses are not conclusive. We have carefully studied the space group of TiBe2 using the convergent beam electron diffraction technique, and unambiguously demonstrated that its space group must be Fd3m.

Measurement of Debye-Waller factors of silicon as a function of temperature using energy-filtered CBED rocking-curve technique

1994 ◽  
Vol 52 ◽  
pp. 996-997
Author(s):  
S. Swaminathan ◽  
S. Altynov ◽  
I. P. Jones ◽  
N. J. Zaluzec ◽  
D. M. Maher ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Liquid Nitrogen Temperature ◽  
Convergent Beam Electron Diffraction ◽  
Higher Order ◽  
X Ray Diffraction ◽  
Beam Electron ◽  
X Ray ◽  
Crystal Potential ◽  
Transmission Electron ◽  
Convergent Beam

The advantages of quantitative Convergent Beam Electron Diffraction (CBED) method for x-ray structure factor determination have been reviewed by Spence. The CBED method requires accurate values of Debye-Waller (D-W) factors for the estimation of the coefficients of crystal potential of the higher order beams, Vg, the calculation of the absorption potential, V′g using the Einstein model for phonons, and finally the conversion of the fitted values of the coefficients of crystal potential, V″, to x-ray structure factors. Debye-Waller factors are conventionally determined by neutron or x-ray diffraction methods. Because of the difficulties in conducting high temperature neutron and x-ray diffraction experiments, D-W factors are rarely measured at temperatures above room temperature. Debye-Waller factors at high temperatures can be determined by Convergent Beam Electron diffraction (CBED) method using Transmission Electron Microscopy (TEM) employed with a hot stage attachment. Recently Holmestad et al. have attempted to measure the D-W factors by matching the energy-filtered Higher Order Laue Zone (HOLZ) line intensities near liquid nitrogen temperature.

Relative Lattice Parameter Measurement in Quaternary (InGaAsP) Layers on InP Substrates Using Convergent Beam Electron Diffraction

1986 ◽  
Vol 69 ◽  
Author(s):  
M. E. Twigg ◽  
S. N. G. Chu ◽  
D. C. Joy ◽  
D. M. Maher ◽  
A. T. Macrander ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Lattice Parameter ◽  
Convergent Beam Electron Diffraction ◽  
X Ray Diffraction ◽  
Device Structure ◽  
Beam Electron ◽  
X Ray ◽  
Convergent Beam ◽  
Relative Change ◽  
Inp Substrates

AbstractWith X-ray diffraction techniques, it is possible to routinely measure lattice parameters to several parts in 104 for macroscopic specimens. However, measurements of lattice parameter changes for quaternary (InGaAsP) device structures several microns in width are not usually feasible with X-ray diffraction techniques. Convergent Beam Electron Diffraction (CBED), which is one of the techniques available on a modern transmission electron microscope (TEM), may be sensitive to these small, localized lattice parameter changes. Unfortunately, dynamical diffraction effects prevent direct extraction of changes in the lattice parameter from CBED patterns which are obtained from high atomic number materials. For this reason, we have chosen to calibrate the relative position of CBED features with X-ray lattice parameter measurements which were obtained from planar quaternary layers grown on InP substrates. For the active quaternary region of an electro-optical device structure, it is shown that this approach may be sensitive to a relative change in the lattice parameter as small as ±2 parts in 104, which is the uncertainty in the X-ray calibration measurements.

Sign in / Sign up

Export Citation Format

Share Document