Excitation cross section of erbium in semiconductor matrices under optical pumping

2001 ◽  
Vol 64 (7) ◽  
Author(s):  
O. B. Gusev ◽  
M. S. Bresler ◽  
P. E. Pak ◽  
I. N. Yassievich ◽  
M. Forcales ◽  
...  
2001 ◽  
Vol 43 (4) ◽  
pp. 625-628 ◽  
Author(s):  
M. S. Bresler ◽  
O. B. Gusev ◽  
P. E. Pak ◽  
E. I. Terukov ◽  
I. N. Yassievich

2014 ◽  
Vol 105 (5) ◽  
pp. 051106 ◽  
Author(s):  
R. Hui ◽  
R. Xie ◽  
I.-W. Feng ◽  
Z. Y. Sun ◽  
J. Y. Lin ◽  
...  

2002 ◽  
Vol 737 ◽  
Author(s):  
F. Priolo ◽  
F. Iacona ◽  
D. Pacifici ◽  
A. Irrera ◽  
M. Miritello ◽  
...  

ABSTRACTThe electroluminescence (EL) properties of Er-doped Si nanoclusters (nc) embedded in metal-oxide-semiconductor devices are investigated. It is shown that, due to the presence of Si nc dispersed in the SiO2 matrix, an efficient carrier injection occurs and Er is excited producing an intense 1.54 μm room temperature luminescence. The EL properties as a function of the current density, temperature and time have been studied in details, elucidating the radiative and non-radiative de-excitation properties of the system. We have also estimated the excitation cross section for Er under electrical pumping finding a value of −1×10 cm. This value is two orders of magnitude higher than the effective excitation cross section of Er ions through Si nc under optical pumping, and quantum efficiencies of ∼1% are obtained at room temperature in these devices. These data will be presented and the impact on future applications discussed.


2001 ◽  
Vol 82-84 ◽  
pp. 651-656
Author(s):  
Oleg B. Gusev ◽  
M.S. Bresler ◽  
P.E. Pak ◽  
I.N. Yassievich ◽  
M. Forcales ◽  
...  

Author(s):  
M. Isaacson

In an earlier paper1 it was found that to a good approximation, the efficiency of collection of electrons that had lost energy due to an inner shell excitation could be written as where σE was the total excitation cross-section and σE(θ, Δ) was the integral cross-section for scattering within an angle θ and with an energy loss up to an energy Δ from the excitation edge, EE. We then obtained: where , with P being the momentum of the incident electron of velocity v. The parameter r was due to the assumption that d2σ/dEdΩ∞E−r for energy loss E. In reference 1 it was assumed that r was a constant.


1965 ◽  
Vol 137 (2A) ◽  
pp. A388-A391 ◽  
Author(s):  
Larry L. Barnes ◽  
Neal F. Lane ◽  
Chun C. Lin

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