Determination of strain fields and composition of self-organized quantum dots using x-ray diffraction

2001 ◽  
Vol 63 (3) ◽  
Author(s):  
I. Kegel ◽  
T. H. Metzger ◽  
A. Lorke ◽  
J. Peisl ◽  
J. Stangl ◽  
...  
Keyword(s):  
Quantum Dots ◽  
X Ray Diffraction ◽  
Strain Fields ◽  
X Ray ◽  
Self Organized

Lateral and vertical ordering in multilayered self-organized InGaAs quantum dots studied by high resolution x-ray diffraction

1997 ◽  
Vol 70 (8) ◽  
pp. 955-957 ◽  
Author(s):  
A. A. Darhuber ◽  
V. Holy ◽  
J. Stangl ◽  
G. Bauer ◽  
A. Krost ◽  
...  
Keyword(s):  
Quantum Dots ◽  
High Resolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Organized

High Resolution X-Ray Diffraction and Reflectivity Studies of Vertical and Lateral Ordering in Multiple Self-Organized InGaAs Quantum Dots

1997 ◽  
Vol 36 (Part 1, No. 6B) ◽  
pp. 4084-4087 ◽  
Author(s):  
Anton A. Darhuber ◽  
Vaclav Holy ◽  
Julian Stangl ◽  
Günther Bauer ◽  
Alois Krost ◽  
...  
Keyword(s):  
Quantum Dots ◽  
High Resolution ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Organized ◽  
Lateral Ordering

Changes in the shapes of self-organized PbSe quantum dots during PbEuTe overgrowth investigated by anomalous X-ray diffraction

2006 ◽  
Vol 253 (1) ◽  
pp. 177-181 ◽  
Author(s):  
V. Holý ◽  
T.U. Schülli ◽  
R.T. Lechner ◽  
G. Springholz ◽  
G. Bauer
Keyword(s):  
Quantum Dots ◽  
X Ray Diffraction ◽  
X Ray ◽  
Self Organized

Direct observation of elastic displacement modes by grazing-incidence X-ray diffraction

2007 ◽  
Vol 40 (5) ◽  
pp. 874-882 ◽  
Author(s):  
Geoffroy Prévot ◽  
Alessandro Coati ◽  
Bernard Croset ◽  
Yves Garreau
Keyword(s):  
Direct Determination ◽  
Grazing Incidence ◽  
Elastic Displacement ◽  
Force Distribution ◽  
X Ray Diffraction ◽  
Vicinal Surfaces ◽  
Electronic Density ◽  
X Ray ◽  
Self Organized

It is demonstrated that grazing-incidence X-ray diffraction is a direct tool for measuring the elastic displacement modes near the surface of a crystal. Due to the fact that X-ray diffraction is a Fourier transform of the electronic density, and thus, of the atomic positions, elastic displacement modes appear as additional spots in the reciprocal space. Their characteristics can be directly derived from the elastic constants of the material. Measuring the amplitude of the diffracted wave for these peaks allows direct determination of the force distribution at the surface, which is at the origin of the elastic displacements. Various examples of such determinations are given for self-organized surfaces and for vicinal surfaces.

Double crystal X-ray diffraction study of MBE self-organized InAs quantum dots

1998 ◽  
Vol 41 (2) ◽  
pp. 172-176 ◽  
Author(s):  
Yutian Wang ◽  
Yan Zhuang ◽  
Wenquan Ma ◽  
Wei Wang ◽  
Xiaoping Yang ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
Inas Quantum Dots ◽  
X Ray ◽  
Self Organized

X-ray diffraction analysis of self-organized InAs quantum dots

1996 ◽  
Author(s):  
Yan Zhuang ◽  
Y.T. Wang ◽  
W.Q. Ma ◽  
W. Wang ◽  
X.P Yang ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Diffraction Analysis ◽  
X Ray Diffraction ◽  
Inas Quantum Dots ◽  
X Ray ◽  
Title X ◽  
Self Organized

Crystal structure of defect-containing semiconductor nanocrystals – an X-ray diffraction study

2009 ◽  
Vol 42 (4) ◽  
pp. 660-672 ◽  
Author(s):  
Maja Buljan ◽  
Uroš V. Desnica ◽  
Nikola Radić ◽  
Goran Dražić ◽  
Zdeněk Matěj ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Profile Analysis ◽  
Semiconductor Nanocrystals ◽  
X Ray Diffraction ◽  
Structure Quality ◽  
X Ray ◽  
Self Organized ◽  
Full Profile

Defects of crystal structure in semiconductor nanocrystals embedded in an amorphous matrix are studied by X-ray diffraction and a full-profile analysis of the diffraction curves based on the Debye formula. A new theoretical model is proposed, describing the diffraction from randomly distributed intrinsic and extrinsic stacking faults and twin blocks in the nanocrystals. The application of the model to full-profile analysis of experimental diffraction curves enables the determination of the concentrations of individual defect types in the nanocrystals. The method has been applied for the investigation of self-organized Ge nanocrystals in an SiO2matrix, and the dependence of the structure quality of the nanocrystals on their deposition and annealing parameters was obtained.

Lateral and Vertical Ordering of PbSe Self-Assembled Quantum Dots in PbSe/PbEuTe Superlattices

2000 ◽  
Vol 618 ◽  
Author(s):  
V. Holý ◽  
J. Stangl ◽  
G. Springholz ◽  
M. Pinczolits ◽  
G. Bauer
Keyword(s):  
Quantum Dots ◽  
Hexagonal Lattice ◽  
Grazing Incidence ◽  
Ideal Gas ◽  
X Ray Diffraction ◽  
Free Standing ◽  
X Ray ◽  
Self Organized ◽  
X Ray Scattering ◽  
Vertical Correlation

ABSTRACTThe shape and the positions of self-organized PbSe quantum dots embedded in PbEuTe are studied by means of grazing-incidence small angle x-ray scattering and x-ray diffraction. Using a detailed numerical analysis of the measured x-ray data, we have determined a truncated pyramidal shape of the free-standing dots. The type of the lateral dot ordering depends substantially on the period of the PbSe/PbEuTe superlattice. In the case of smaller periods, the lateral ordering of the dots obeys a short-range order model and we have determined the statistical properties of the dot arrangement. For intermediate spacer thicknesses the dots form a hexagonal lattice. For larger periods, the dots are completely uncorrelated and their distribution can be described as a two-dimensional ideal gas. From coplanar x-ray diffraction we have determined additionally the vertical correlation of the dot positions changes from a mere vertical correlation for small superlattice periods, to a distorted trigonal lattice for the intermediate periods. For the largest period, no vertical correlation of dot positions is observed.

Sem and X-Ray Analysis of Renal and Biliary Calculi

1976 ◽  
Vol 34 ◽  
pp. 306-307
Author(s):  
R. J. Narconis ◽  
G. L. Johnson
Keyword(s):  
Chemical Constituents ◽  
Natural State ◽  
X Ray Diffraction ◽  
Chemical Methods ◽  
X Ray ◽  
Additional Dimension ◽  
Biliary Calculi ◽  
Calculus Formation ◽  
Scanning Electron

Analysis of the constituents of renal and biliary calculi may be of help in the management of patients with calculous disease. Several methods of analysis are available for identifying these constituents. Most common are chemical methods, optical crystallography, x-ray diffraction, and infrared spectroscopy. The application of a SEM with x-ray analysis capabilities should be considered as an additional alternative.A scanning electron microscope equipped with an x-ray “mapping” attachment offers an additional dimension in its ability to locate elemental constituents geographically, and thus, provide a clue in determination of possible metabolic etiology in calculus formation. The ability of this method to give an undisturbed view of adjacent layers of elements in their natural state is of advantage in determining the sequence of formation of subsequent layers of chemical constituents.

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