Localization length and impurity dielectric susceptibility in the critical regime of the metal-insulator transition in homogeneously dopedp-typeGe
1994 ◽
Vol 08
(07)
◽
pp. 905-912
◽
1997 ◽
Vol 9
(20)
◽
pp. 4145-4156
◽
2013 ◽
Vol 27
(04)
◽
pp. 1350029
◽
Keyword(s):
2003 ◽
Vol 17
(18n20)
◽
pp. 3723-3725
◽
1993 ◽
Vol 48
(24)
◽
pp. 17685-17694
◽