Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films
2000 ◽
Vol 61
(16)
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pp. 10832-10844
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2006 ◽
Vol 45
(1B)
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pp. 526-529
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Keyword(s):
2004 ◽
Vol 22
(4)
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pp. 1115-1119
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2009 ◽
Vol 321
(18)
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pp. 2707-2711
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Keyword(s):
2002 ◽
Vol 20
(4)
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pp. 1369-1373
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Keyword(s):