Grazing Incidence X-Ray Diffraction Measurements of InAs/GaAs Quantum Dots Using Equipment Available for Laboratories

2012 ◽  
Vol 7 (3) ◽  
pp. 245-254 ◽  
Author(s):  
Kohki Mukai
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Investigation of buried quantum dots using grazing incidence X-ray diffraction

2012 ◽  
Vol 177 (10) ◽  
pp. 721-724 ◽  
Author(s):  
P. Schroth ◽  
T. Slobodskyy ◽  
D. Grigoriev ◽  
A. Minkevich ◽  
M. Riotte ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

Generalized Grazing Incidence-Angle X-Ray Diffraction Studies on InAs Quantum Dots on Si (100) Substrates

2000 ◽  
Vol 39 (Part 1, No. 7B) ◽  
pp. 4483-4485 ◽  
Author(s):  
Takeshi Uragami ◽  
Hiroshi Fujioka ◽  
Ichitaro Waki ◽  
Takaaki Mano ◽  
Kanta Ono ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Incidence Angle ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Inas Quantum Dots ◽  
X Ray ◽  
Grazing Incidence Angle

Lateral and Vertical Ordering of PbSe Self-Assembled Quantum Dots in PbSe/PbEuTe Superlattices

2000 ◽  
Vol 618 ◽  
Author(s):  
V. Holý ◽  
J. Stangl ◽  
G. Springholz ◽  
M. Pinczolits ◽  
G. Bauer
Keyword(s):  
Quantum Dots ◽  
Hexagonal Lattice ◽  
Grazing Incidence ◽  
Ideal Gas ◽  
X Ray Diffraction ◽  
Free Standing ◽  
X Ray ◽  
Self Organized ◽  
X Ray Scattering ◽  
Vertical Correlation

ABSTRACTThe shape and the positions of self-organized PbSe quantum dots embedded in PbEuTe are studied by means of grazing-incidence small angle x-ray scattering and x-ray diffraction. Using a detailed numerical analysis of the measured x-ray data, we have determined a truncated pyramidal shape of the free-standing dots. The type of the lateral dot ordering depends substantially on the period of the PbSe/PbEuTe superlattice. In the case of smaller periods, the lateral ordering of the dots obeys a short-range order model and we have determined the statistical properties of the dot arrangement. For intermediate spacer thicknesses the dots form a hexagonal lattice. For larger periods, the dots are completely uncorrelated and their distribution can be described as a two-dimensional ideal gas. From coplanar x-ray diffraction we have determined additionally the vertical correlation of the dot positions changes from a mere vertical correlation for small superlattice periods, to a distorted trigonal lattice for the intermediate periods. For the largest period, no vertical correlation of dot positions is observed.

scholarly journals Density dependent composition of InAs quantum dots extracted from grazing incidence x-ray diffraction measurements

2015 ◽  
Vol 5 (1) ◽  
Author(s):  
Manjula Sharma ◽  
Milan K. Sanyal ◽  
Ian Farrer ◽  
David A. Ritchie ◽  
Arka B. Dey ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
Inas Quantum Dots ◽  
X Ray ◽  
Density Dependent

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

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