High-resolution core-level study of initial oxygen adsorption on Si(001): Surface stoichiometry and anomalous Si2pcore-level shifts

1999 ◽  
Vol 59 (16) ◽  
pp. R10413-R10416 ◽  
Author(s):  
H. W. Yeom ◽  
H. Hamamatsu ◽  
T. Ohta ◽  
R. I. G. Uhrberg
1995 ◽  
Vol 76 ◽  
pp. 139-144 ◽  
Author(s):  
C. Ottaviani ◽  
M. Capozi ◽  
C. Quaresima ◽  
M. Matteucci ◽  
C. Crotti ◽  
...  

2004 ◽  
Vol 135 (2-3) ◽  
pp. 105-112 ◽  
Author(s):  
M.J Gladys ◽  
I Ermanoski ◽  
G Jackson ◽  
J.S Quinton ◽  
J.E Rowe ◽  
...  

1995 ◽  
Vol 67 (14) ◽  
pp. 2049-2051 ◽  
Author(s):  
C. H. Bjorkman ◽  
J. L. Alay ◽  
H. Nishimura ◽  
M. Fukuda ◽  
T. Yamazaki ◽  
...  

2002 ◽  
Vol 09 (02) ◽  
pp. 723-727 ◽  
Author(s):  
T. H. ANDERSEN ◽  
L. BECH ◽  
J. ONSGAARD ◽  
S. V. HOFFMANN ◽  
Z. LI

Copper adsorption on Ru(0001) has been studied by synchrotron radiation. The clean Ru 3d 5/2 spectra were found to consist of two components with a binding energy shift of 400 meV. The component with the lower binding energy represents the first layer of ruthenium atoms. Adsorption of copper gives rise to core level shifts of the Ru 3d 5/2 components, which were studied as a function of Cu coverage. Experiments were carried out with copper coverages varying from the submonolayer range up to two monolayers of copper. The binding energy of the Cu 2p 3/2 level was measured by X-ray photoemission spectroscopy.


2000 ◽  
Vol 166 (1-4) ◽  
pp. 214-219 ◽  
Author(s):  
P De Padova ◽  
R Larciprete ◽  
C Quaresima ◽  
A Reginelli ◽  
P Perfetti

2006 ◽  
Vol 243 (11) ◽  
pp. 2447-2464 ◽  
Author(s):  
Weine Olovsson ◽  
Christian Göransson ◽  
Tobias Marten ◽  
Igor A. Abrikosov

1988 ◽  
Vol 206 (3) ◽  
pp. L871-L879 ◽  
Author(s):  
K.C. Prince ◽  
G. Paolucci ◽  
V. Cháb ◽  
M. Surman ◽  
A.M. Bradshaw
Keyword(s):  

1990 ◽  
Vol 41 (6) ◽  
pp. 1034-1036 ◽  
Author(s):  
J C Woicik ◽  
T Kendelewicz ◽  
K Miyano ◽  
R Cao ◽  
P Pianetta ◽  
...  

1989 ◽  
Vol 40 (18) ◽  
pp. 12463-12467 ◽  
Author(s):  
J. C. Woicik ◽  
P. Pianetta ◽  
T. Kendelewicz
Keyword(s):  

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