Dielectric relaxation modes in bismuth-dopedSrTiO3: The relaxor behavior

1999 ◽  
Vol 59 (10) ◽  
pp. 6670-6674 ◽  
Author(s):  
Chen Ang ◽  
Zhi Yu ◽  
P. Lunkenheimer ◽  
J. Hemberger ◽  
A. Loidl
2011 ◽  
Vol 109 (1) ◽  
pp. 014114 ◽  
Author(s):  
P. K. Bajpai ◽  
Mukul Pastor ◽  
K. N. Singh

2007 ◽  
Vol 51 (12) ◽  
pp. 133 ◽  
Author(s):  
Jin Soo KIM ◽  
Jung Hyun JEONG ◽  
Sung Yong CHO ◽  
M. S. JANG ◽  
Sang-Bock CHO

2005 ◽  
Vol 19 (26) ◽  
pp. 1335-1346 ◽  
Author(s):  
SYED MAHBOOB ◽  
G. PRASAD ◽  
G. S. KUMAR ◽  
A. R. JAMES ◽  
CHANDRA PRAKASH

Dielectric measurements were made over the temperature range 80–300 K at different frequencies (10 kHz, 50 kHz, 100 kHz, 500 kHz and 1 MHz). The degree of relaxor behavior and diffuseness of phase transition were correlated to the cationic disorder at lattice site B. Non-Debye dielectric behavior was observed in the present samples and a modified Arrhenius relation proposed by Chen et al. was found to best describe the frequency dependent dielectric maxima temperature.


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