scholarly journals Epitaxial thin-film growth ofC60onVSe2studied with scanning tunneling microscopy and x-ray diffraction

1999 ◽  
Vol 59 (20) ◽  
pp. 13394-13400 ◽  
Author(s):  
R. Schwedhelm ◽  
J.-P. Schlomka ◽  
S. Woedtke ◽  
R. Adelung ◽  
L. Kipp ◽  
...  
Keyword(s):  
Thin Film ◽  
Scanning Tunneling Microscopy ◽  
Film Growth ◽  
Thin Film Growth ◽  
Scanning Tunneling ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
Epitaxial Thin Film ◽  
X Ray ◽  
Epitaxial Thin Film Growth

scholarly journals Interface morphology of a Cr(001)/Fe(001) superlattice determined by scanning tunneling microscopy and x-ray diffraction: A comparison

2001 ◽  
Vol 89 (1) ◽  
pp. 181-187 ◽  
Author(s):  
C. M. Schmidt ◽  
D. E. Bürgler ◽  
D. M. Schaller ◽  
F. Meisinger ◽  
H.-J. Güntherodt ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Interface Morphology ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
X Ray

On the solutions of a fourth order parabolic equation modeling epitaxial thin film growth

2016 ◽  
Vol 66 (3) ◽  
Author(s):  
Ning Duan ◽  
Xiaopeng Zhao ◽  
Xiufang Zhao
Keyword(s):  
Thin Film ◽  
Parabolic Equation ◽  
Fourth Order ◽  
Film Growth ◽  
Thin Film Growth ◽  
Equation Modeling ◽  
Epitaxial Thin Film ◽  
Epitaxial Thin Film Growth ◽  
Order Parabolic Equation ◽  
Fourth Order Parabolic Equation

AbstractIn this paper, we study the existence and uniqueness of global weak solution, the regularity of the solutions and the existence of global attractor for a fourth order parabolic equation modeling epitaxial thin film growth with Neumann boundary conditions in two space dimensions.

Combinatorial (Ba,Sr)TiO3 thin film growth: X-ray diffraction and Raman spectroscopy

2009 ◽  
Vol 106 (3) ◽  
pp. 034108 ◽  
Author(s):  
H. Bouyanfif ◽  
J. Wolfman ◽  
M. El Marssi ◽  
Y. Yuzyuk ◽  
R. Bodeux ◽  
...  
Keyword(s):  
Thin Film ◽  
Raman Spectroscopy ◽  
Film Growth ◽  
Thin Film Growth ◽  
Tio3 Thin Film ◽  
X Ray Diffraction ◽  
X Ray
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