Use of Si 2p x-ray photoelectron diffraction as a test of epitaxial thin film growth by Si evaporation on Si(001)
1992 ◽
Vol 19
(1-12)
◽
pp. 336-340
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Keyword(s):
X Ray
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1992 ◽
Vol 1
(2-4)
◽
pp. 109-120
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2003 ◽
Vol 286
(2)
◽
pp. 459-490
◽
1993 ◽
Keyword(s):
Keyword(s):
1999 ◽
Vol 266
(1-4)
◽
pp. 173-185
◽
Keyword(s):
Keyword(s):
Keyword(s):