Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects inCuGaSe2

1999 ◽  
Vol 59 (19) ◽  
pp. 12268-12271 ◽  
Author(s):  
M. Birkholz ◽  
P. Kanschat ◽  
T. Weiss ◽  
M. Czerwensky ◽  
K. Lips
2017 ◽  
Vol 274 ◽  
pp. 73-79 ◽  
Author(s):  
Ryhor Fedaruk ◽  
Roman Strzelczyk ◽  
Krzysztof Tadyszak ◽  
Siarhei A. Markevich ◽  
Maria Aldona Augustyniak-Jabłokow

1991 ◽  
Vol 241 ◽  
Author(s):  
H. J. von Bardeleben ◽  
Y. Q. Jia ◽  
J. P. Hirtz ◽  
J. C. Garcia ◽  
M. O. Manasreh ◽  
...  

ABSTRACTThe native defects in LTMBE III-V layers have been studied by the electron paramagnetic resonance (EPR) technique for three different systems: GaAs on GaAs, GaAs on Si and InP on InP. The GaAs layers are characterised by high concentrations of ionized arsenic antisite defects(1019 cm −3), with properties similar to those of the native AsGa in amorphous GaAs. Their variation with the growth temperature, layer thickness and thermal annealings has been assessed.The results are independant on the nature of the substrate, GaAs or Si. Inspite of a 1% phosphorous excess no phosphorous antisites could be detected in the as-grown, undoped or Be doped InP layers.


2000 ◽  
Vol 88 (3) ◽  
pp. 1587-1592 ◽  
Author(s):  
Yu. A. Koksharov ◽  
S. P. Gubin ◽  
I. D. Kosobudsky ◽  
M. Beltran ◽  
Y. Khodorkovsky ◽  
...  

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