Polarized reflectance measurements of the CDW transitions inη−Mo4O11andγ−Mo4O11

1998 ◽  
Vol 58 (20) ◽  
pp. 13565-13573 ◽  
Author(s):  
A. W. McConnell ◽  
B. P. Clayman ◽  
C. C. Homes ◽  
M. Inoue ◽  
H. Negishi
Keyword(s):  
Reflectance Measurements ◽  
Polarized Reflectance

Calculation of Spectral Optical Constants Using Combined Ellipsometric and Reflectance Methods for Smooth and Rough Bulk Samples

2021 ◽  
pp. 000370282110478
Author(s):  
Gilles Fortin
Keyword(s):  
Rough Surface ◽  
Optical Constants ◽  
Sample Surface ◽  
Infrared Region ◽  
Homogeneous Sample ◽  
Specular Reflectance ◽  
Scattering Effects ◽  
Spectral Ranges ◽  
Reflectance Measurements ◽  
Polarized Reflectance

Spectra of the optical constants n and k of a substance are often deduced from spectroscopic measurements, performed on a thick and homogeneous sample, and from a model used to simulate these measurements. Spectra obtained for n and k using the ellipsometric method generally produce polarized reflectance simulations in strong agreement with the experimental measurements, but they sometimes introduce significant discrepancies over limited spectral ranges, whereas spectra of n and k obtained with the single-angle reflectance method require a perfectly smooth sample surface to be viable. This paper presents an alternative method to calculate n and k. The method exploits both ellipsometric measurements and s-polarized specular reflectance measurements, and compensates for potential surface scattering effects with the introduction of a specularity factor. It is applicable to bulk samples having either a smooth or a rough surface. It provides spectral optical constants that are consistent with s-polarized reflectance measurements. Demonstrations are performed in the infrared region using a glass slide (smooth surface) and a pellet of compressed ammonium sulfate powder (rough surface).

scholarly journals Accuracy assessments of cloud droplet size retrievals from polarized reflectance measurements by the research scanning polarimeter

2012 ◽  
Vol 125 ◽  
pp. 92-111 ◽  
Author(s):  
Mikhail D. Alexandrov ◽  
Brian Cairns ◽  
Claudia Emde ◽  
Andrew S. Ackerman ◽  
Bastiaan van Diedenhoven
Keyword(s):  
Droplet Size ◽  
Cloud Droplet ◽  
Accuracy Assessments ◽  
Reflectance Measurements ◽  
Polarized Reflectance

Optical constants of YBaCuO from polarized reflectance measurements

1994 ◽  
Vol 223 (1-2) ◽  
pp. 117-122 ◽  
Author(s):  
W. Markowitsch ◽  
W. Mayr ◽  
P. Schwab ◽  
X.Z. Wang
Keyword(s):  
Optical Constants ◽  
Reflectance Measurements ◽  
Polarized Reflectance

Forensic applications of IR infrared microscopic internal reflection spectroscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1528-1529
Author(s):  
Edward G. Bartick ◽  
John A. Reffner
Keyword(s):  
Specular Reflection ◽  
Forensic Analysis ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
Standard Size ◽  
Ir Microscopy ◽  
Ir Analysis ◽  
Plastic Explosives ◽  
Internal Reflection Spectroscopy ◽  
Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

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