scholarly journals X-ray diffraction, thermal analysis, and Raman scattering study ofK2BeF4and comparison to other members of theβ−K2SO4family with ferroelectric-paraelectric transitions

1998 ◽  
Vol 57 (9) ◽  
pp. 5122-5125 ◽  
Author(s):  
X. Solans ◽  
C. Gonzalez-Silgo ◽  
T. Calvet ◽  
C. Ruiz-Pérez ◽  
M. L. Martínez-Sarrión ◽  
...  
Keyword(s):  
Thermal Analysis ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study

A combined X-ray diffraction and Raman scattering study of the phase transitions in Sr1−xCaxTiO3 (x=0.04, 0.06, and 0.12)

2005 ◽  
Vol 178 (9) ◽  
pp. 2846-2857 ◽  
Author(s):  
Sanjay Kumar Mishra ◽  
Rajeev Ranjan ◽  
Dhananjai Pandey ◽  
Pierre Ranson ◽  
Robert Ouillon ◽  
...  
Keyword(s):  
Phase Transitions ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study

Cu 3 TaSe 4 and Cu 3 NbSe 4 : X-ray diffraction, differential thermal analysis, optical absorption and Raman scattering

2016 ◽  
Vol 658 ◽  
pp. 749-756 ◽  
Author(s):  
P. Grima-Gallardo ◽  
M. Salas ◽  
O. Contreras ◽  
Ch. Power ◽  
M. Quintero ◽  
...  
Keyword(s):  
Thermal Analysis ◽  
Differential Thermal Analysis ◽  
Optical Absorption ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray

X-ray diffraction and Raman scattering study of SrBi2Ta2O9 ceramics and thin films with Bi3TiNbO9 addition

2001 ◽  
Vol 79 (23) ◽  
pp. 3827-3829 ◽  
Author(s):  
J. S. Zhu ◽  
H. X. Qin ◽  
Z. H. Bao ◽  
Y. N. Wang ◽  
W. Y. Cai ◽  
...  
Keyword(s):  
Thin Films ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study

X-Ray Diffraction and Raman Scattering Study of Sr1-xBi2+yTa2O9 Nanoparticles

2005 ◽  
pp. 3539-3542
Author(s):  
Yu Zhou ◽  
Hua Ke ◽  
De Chang Jia ◽  
W. Wang ◽  
J.C. Rao
Keyword(s):  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study

EDS, XRD and Raman Scattering Study of Dy Ion Implanted CdTe Polycrystalline Thin Films

2011 ◽  
Vol 213 ◽  
pp. 157-160
Author(s):  
Juan Hou ◽  
Hai Bin Cao ◽  
Xu Chu Huang ◽  
Chun Yan Song
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
Polycrystalline Thin Film ◽  
X Ray ◽  
Polycrystalline Thin Films ◽  
Lattice Damage ◽  
Scattering Study ◽  
Ion Implanted

Dysprosium (Dy) ion implanted CdTe polycrystalline thin film (PTF) deposited on the ceramic substrate by the close spaced sublimation （CSS) method. Both the energy dispersive X-ray spectrometer（EDS）and Raman scattering analysis show that the as-deposited and Dy ion implanted CdTe PTF are non-stoichiometric with excess telluride. Furthermore, X-ray diffraction study reveals that the CdTe PTF forms a zinc-blended structure. In the Raman scattering analysis, the position of the peak on implantation does not change apparently whereas the intensity of the peak decreases owing to the lattice damage and increases as a result of thermal annealing. The data support that Raman activity is enhanced after Dy ion implantation.

ChemInform Abstract: Cu3TaSe4and Cu3NbSe4: X-Ray Diffraction, Differential Thermal Analysis, Optical Absorption and Raman Scattering.

ChemInform ◽  
2016 ◽  
Vol 47 (10) ◽  
pp. no-no
Author(s):  
P. Grima-Gallardo ◽  
M. Salas ◽  
O. Contreras ◽  
Ch. Power ◽  
M. Quintero ◽  
...  
Keyword(s):  
Thermal Analysis ◽  
Differential Thermal Analysis ◽  
Optical Absorption ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray

X-ray diffraction and high-pressure Raman scattering study of iodine-intercalated Bi2Sr2CaCu2O8+x

1991 ◽  
Vol 185-189 ◽  
pp. 825-826 ◽  
Author(s):  
C.H. Qiu ◽  
S.P. Ahrenkiel ◽  
N. Wada ◽  
T.F. Ciszek
Keyword(s):  
High Pressure ◽  
Raman Scattering ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Study
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