Single crystal of colloidal silica particles in a dilute aqueous dispersion as studied by a two-dimensional ultrasmall-angle x-ray scattering

1998 ◽  
Vol 57 (5) ◽  
pp. 2655-2658 ◽  
Author(s):  
Toshiki Konishi ◽  
Norio Ise
Keyword(s):  
Single Crystal ◽  
Colloidal Silica ◽  
Aqueous Dispersion ◽  
Silica Particles ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Structural changes of silica particles in elongated rubber by two-dimensional small-angle X-ray scattering and extended reverse Monte Carlo analysis

2008 ◽  
Vol 47 (5-6) ◽  
pp. 537-541 ◽  
Author(s):  
Katsumi Hagita ◽  
Takashi Arai ◽  
Hiroyuki Kishimoto ◽  
Norimasa Umesaki ◽  
Hiroya Suno ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Small Angle ◽  
Structural Changes ◽  
Monte Carlo Analysis ◽  
Silica Particles ◽  
Reverse Monte Carlo ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Two-dimensional intensity profiles of effective satellites

2002 ◽  
Vol 35 (1) ◽  
pp. 69-74 ◽  
Author(s):  
S. L. Morelhão ◽  
L. H. Avanci ◽  
A. A. Quivy ◽  
E. Abramof
Keyword(s):  
Synchrotron Radiation ◽  
Single Crystal ◽  
Structural Parameters ◽  
Azimuthal Angle ◽  
Two Dimensional ◽  
Scattering Process ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Diffraction ◽  
Ray Scattering

The observation of a new X-ray scattering process with synchrotron radiation is reported. The phenomenon is analogous to three-beam diffraction in a single crystal; however, the features in the azimuthal scans are provided by superlattice-satellite reflections instead of bulk reflections. These features were named effective satellites and they are observed over the ordinary satellite reflections as a function of the azimuthal angle. Their occurrences have been monitored in completely different superlattices by mapping the incidence and azimuthal angles of the incident X-ray beam. Effects of structural parameters of the superlattices on the effective satellites as well as the information that can be extracted by measuring their positions are discussed.

Construction of a Two-Dimensional Ultra-Small-Angle X-ray Scattering Apparatus

1997 ◽  
Vol 30 (5) ◽  
pp. 854-856 ◽  
Author(s):  
T. Konishi ◽  
E. Yamahara ◽  
T. Furuta ◽  
N. Ise
Keyword(s):  
Small Angle ◽  
Colloidal Silica ◽  
Two Dimensional ◽  
Detector Plane ◽  
Measured Intensity ◽  
One Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Oriented Samples ◽  
Ray Scattering

A two-dimensional ultra-small-angle X-ray scattering (USAXS) apparatus was constructed using a rotating-anode X-ray generator and a Bonse–Hart camera. In this camera, two sets of two channel-cut single crystals were used to collimate the X-ray beam in both the horizontal and the vertical planes. The measured intensity profile of the direct beam showed a high small-angle resolution in all directions on the detector plane. The full width at half-maximum was 17′′, indicating that the apparatus can be applied to structural analysis in the range up to 2 μm, even for directionally oriented samples. One- and two-dimensional USAXS profiles from colloidal silica powder agreed well with each other, showing that the desmearing procedure adopted in the previous one-dimensional USAXS experiments were justified.

Characterization of Colloidal Silica Particles by Ultra-Small-Angle X-ray Scattering

Langmuir ◽  
1996 ◽  
Vol 12 (10) ◽  
pp. 2608-2610 ◽  
Author(s):  
Toshiki Konishi ◽  
Eiji Yamahara ◽  
Norio Ise
Keyword(s):  
Small Angle ◽  
Colloidal Silica ◽  
Silica Particles ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Pinhole-type two-dimensional ultra-small-angle X-ray scattering on the micrometer scale

2013 ◽  
Vol 21 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Hiroyuki Kishimoto ◽  
Yuya Shinohara ◽  
Yoshio Suzuki ◽  
Akihisa Takeuchi ◽  
Naoto Yagi ◽  
...  
Keyword(s):  
Small Angle ◽  
Two Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Detector Distance ◽  
Medium Length ◽  
Set Up ◽  
Micrometer Scale ◽  
Ray Scattering

A pinhole-type two-dimensional ultra-small-angle X-ray scattering set-up at a so-called medium-length beamline at SPring-8 is reported. A long sample-to-detector distance, 160.5 m, can be used at this beamline and a small-angle resolution of 0.25 µm−1was thereby achieved at an X-ray energy of 8 keV.

Diffuse x-ray scattering study of single crystal alpha-AgI

1983 ◽  
Vol 9-10 ◽  
pp. 1347-1351 ◽  
Author(s):  
R.J Cava ◽  
R.M Fleming ◽  
E.A Rietman
Keyword(s):  
Single Crystal ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering
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